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NATHAN DANIEL ORLOFF IV
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BOULDER, CO, US
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Patents Grants
last 30 patents
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Patent Grant
Scanning microwave ellipsometer and performing scanning microwave e...
Patent number
11,287,366
Issue date
Mar 29, 2022
GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
Christian John Long
G01 - MEASURING TESTING
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Patent Grant
Noncontact resonameter, process for making and use of same
Patent number
10,261,032
Issue date
Apr 16, 2019
National Institute of Standards and Technology
Nathan Daniel Orloff
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SCANNING MICROWAVE ELLIPSOMETER AND PERFORMING SCANNING MICROWAVE E...
Publication number
20200348224
Publication date
Nov 5, 2020
Government of the United States of America, as Represented by the Secretary o...
Christian John Long
G01 - MEASURING TESTING
Information
Patent Application
NONCONTACT RESONAMETER, PROCESS FOR MAKING AND USE OF SAME
Publication number
20160161424
Publication date
Jun 9, 2016
NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
NATHAN DANIEL ORLOFF
G01 - MEASURING TESTING