Nathan N. Strader

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of qualifying a process tool with wafer defect maps
- Patent number 7,079,966
- Issue date Jul 18, 2006
- LSI Logic Corporation
- John A. Knoch
- G01 - MEASURING TESTING
Information Patent Grant
Wafer edge inspection data gathering
- Patent number 7,013,222
- Issue date Mar 14, 2006
- LSI Logic Corporation
- Nathan N. Strader
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of qualifying a process tool with wafer defect maps
- Publication number 20050065739
- Publication date Mar 24, 2005
- John A. Knoch
- G01 - MEASURING TESTING
Information Patent Application
Wafer edge inspection data gathering
- Publication number 20050060104
- Publication date Mar 17, 2005
- Nathan N. Strader
- G01 - MEASURING TESTING