Natsuki Sato

Person

Koriyama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for determining drug-sensitive human cell lines by analysis...
- Patent number 10,995,359
- Issue date May 4, 2021
- Nitto Boseki Co., LTD
- Masayuki Wakabayashi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for determining drug-sensitive human cell lines by analysis...
- Patent number 10,724,071
- Issue date Jul 28, 2020
- Nitto Boseki Co., Ltd.
- Masayuki Wakabayashi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Test instrument for measuring analyte in sample by an aggregation a...
- Patent number 10,670,586
- Issue date Jun 2, 2020
- Nitto Boseki Co., Ltd.
- Ryo Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Method of assaying complex and kit to be used therefor
- Patent number 8,900,882
- Issue date Dec 2, 2014
- Nitto Boseki Co., Ltd.
- Kiyotaka Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Nonvolatile memory device
- Patent number 8,129,709
- Issue date Mar 6, 2012
- Elpida Memory, Inc.
- Akiyoshi Seko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing phase change memory device
- Patent number 7,985,693
- Issue date Jul 26, 2011
- Elpida Memory, Inc.
- Akiyoshi Seko
- G11 - INFORMATION STORAGE
Information Patent Grant
Phase change memory device and fabrication method thereof
- Patent number 7,915,602
- Issue date Mar 29, 2011
- Elpida Memory, Inc.
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacture method thereof
- Patent number 7,829,878
- Issue date Nov 9, 2010
- Elpida Memory, Inc.
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrically rewritable non-volatile memory element and method of m...
- Patent number 7,692,272
- Issue date Apr 6, 2010
- Elpida Memory, Inc.
- Isamu Asano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of producing the same
- Patent number 7,671,360
- Issue date Mar 2, 2010
- Elpida Memory, Inc.
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of producing the same
- Patent number 7,589,344
- Issue date Sep 15, 2009
- Elpida Memory, Inc.
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrically rewritable non-volatile memory element and method of m...
- Patent number 7,589,364
- Issue date Sep 15, 2009
- Elpida Memory, Inc.
- Isamu Asano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with high- and low-density regions of transist...
- Patent number 6,828,188
- Issue date Dec 7, 2004
- NEC Electronics Corporation
- Toshiyuki Hirota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wiring structure with divided wiring conductors to achieve planarit...
- Patent number 6,236,106
- Issue date May 22, 2001
- NEC Corporation
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device and method of fabricating the same
- Patent number 6,175,132
- Issue date Jan 16, 2001
- NEC Corporation
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and fabrication method thereof
- Patent number 5,994,731
- Issue date Nov 30, 1999
- NEC Corporation
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photoresist check patterns in highly integrated circuits having mul...
- Patent number 5,981,114
- Issue date Nov 9, 1999
- NEC Corporation
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 5,918,148
- Issue date Jun 29, 1999
- NEC Corporation
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device having a peak concentr...
- Patent number 5,915,184
- Issue date Jun 22, 1999
- NEC Corporation
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having a concentration peak position coincidin...
- Patent number 5,736,775
- Issue date Apr 7, 1998
- NEC Corporation
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process of fabricating memory cell with a switching transistor and...
- Patent number 5,521,111
- Issue date May 28, 1996
- NEC Corporation
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device
- Patent number 5,504,704
- Issue date Apr 2, 1996
- NEC Corporation
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for making contact holes in semiconductor devices
- Patent number 5,424,247
- Issue date Jun 13, 1995
- NEC Corporation
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making a semiconductor memory device
- Patent number 5,416,037
- Issue date May 16, 1995
- NEC Corporation
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device
- Patent number 5,386,131
- Issue date Jan 31, 1995
- NEC Corporation
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating semiconductor device having a trenched cell c...
- Patent number 5,330,926
- Issue date Jul 19, 1994
- NEC Corporation
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating a semiconductor device
- Patent number 5,169,801
- Issue date Dec 8, 1992
- NEC Corporation
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETERMINING DRUG-SENSITIVE HUMAN CELL LINES BY ANALYSIS...
- Publication number 20200308623
- Publication date Oct 1, 2020
- NITTO BOSEKI CO., LTD.
- Masayuki WAKABAYASHI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD FOR DETERMINING DRUG-SENSITIVE HUMAN CELL LINES BY ANALYSIS...
- Publication number 20180291421
- Publication date Oct 11, 2018
- NITTO BOSEKI CO., LTD.
- Masayuki WAKABAYASHI
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
FBC MEMORY OR THYRISTOR MEMORY FOR REFRESHING UNUSED WORD LINE
- Publication number 20150228325
- Publication date Aug 13, 2015
- PS4 LUXCO S.A.R.L.
- Shuichi Tsukada
- G11 - INFORMATION STORAGE
Information Patent Application
TEST INSTRUMENT FOR MEASURING ANALYTE IN SAMPLE, AND METHOD FOR MEA...
- Publication number 20130084651
- Publication date Apr 4, 2013
- NITTO BOSEKI CO., LTD.
- Ryo Kojima
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ASSAYING COMPLEX AND KIT TO BE USED THEREFOR
- Publication number 20110136261
- Publication date Jun 9, 2011
- NITTO BOSEKI CO., LTD.
- Kiyotaka Fujita
- G01 - MEASURING TESTING
Information Patent Application
NONVOLATILE MEMORY DEVICE
- Publication number 20100123114
- Publication date May 20, 2010
- ELPIDA MEMORY, INC.
- Akiyoshi SEKO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NONVOLATILE MEMORY DEVICE AND MANUFACTURING PROCESS THEREOF
- Publication number 20100078616
- Publication date Apr 1, 2010
- Elpida Memory, Inc.
- Akiyoshi Seko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase change memory device and fabrication method thereof
- Publication number 20090218557
- Publication date Sep 3, 2009
- ELPIDA MEMORY, INC.
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Nonvolatile memory device and manufacturing method for the same
- Publication number 20090221146
- Publication date Sep 3, 2009
- Elpida Memory, Inc.
- Akiyoshi Seko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of producing phase change memory device
- Publication number 20090104779
- Publication date Apr 23, 2009
- ELPIDA MEMORY, INC.
- Akiyoshi Seko
- G11 - INFORMATION STORAGE
Information Patent Application
Method of producing phase change memory device
- Publication number 20090101885
- Publication date Apr 23, 2009
- ELPIDA MEMORY, INC.
- Akiyoshi Seko
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20080210923
- Publication date Sep 4, 2008
- Elpida Memory, Inc.
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF PRODUCING THE SAME
- Publication number 20080061282
- Publication date Mar 13, 2008
- Elpida Memory, Inc.
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20080054246
- Publication date Mar 6, 2008
- Elpida Memory, Inc.
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURE METHOD THEREOF
- Publication number 20080048168
- Publication date Feb 28, 2008
- Elpida Memory, Inc.
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrically rewritable non-volatile memory element and method of m...
- Publication number 20070164267
- Publication date Jul 19, 2007
- ELPIDA MEMORY, INC.
- Isamu Asano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrically rewritable non-volatile memory element and method of m...
- Publication number 20070096074
- Publication date May 3, 2007
- ELPIDA MEMORY, INC.
- Isamu Asano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrically rewritable non-volatile memory element and method of m...
- Publication number 20070063180
- Publication date Mar 22, 2007
- ELPIDA MEMORY, INC.
- Isamu Asano
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device and method of producing the same
- Publication number 20070018149
- Publication date Jan 25, 2007
- Elpida Memory, Inc.
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor memory device and method of fabricating the same
- Publication number 20010039086
- Publication date Nov 8, 2001
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device with high- and low-density regions of transist...
- Publication number 20010006834
- Publication date Jul 5, 2001
- NEC Corporation
- Toshiyuki Hirota
- H01 - BASIC ELECTRIC ELEMENTS

Natsuki Sato

Person

Patents Grantslast 30 patents

Method for determining drug-sensitive human cell lines by analysis...

Method for determining drug-sensitive human cell lines by analysis...

Test instrument for measuring analyte in sample by an aggregation a...

Method of assaying complex and kit to be used therefor

Nonvolatile memory device

Method of producing phase change memory device

Phase change memory device and fabrication method thereof

Semiconductor device and manufacture method thereof

Electrically rewritable non-volatile memory element and method of m...

Semiconductor device and method of producing the same

Semiconductor device and method of producing the same

Electrically rewritable non-volatile memory element and method of m...

Semiconductor device with high- and low-density regions of transist...

Wiring structure with divided wiring conductors to achieve planarit...

Semiconductor memory device and method of fabricating the same

Semiconductor device and fabrication method thereof

Photoresist check patterns in highly integrated circuits having mul...

Method for manufacturing semiconductor device

Method of manufacturing semiconductor device having a peak concentr...

Semiconductor device having a concentration peak position coincidin...

Process of fabricating memory cell with a switching transistor and...

Semiconductor memory device

Method for making contact holes in semiconductor devices

Method of making a semiconductor memory device

Semiconductor memory device

Method of fabricating semiconductor device having a trenched cell c...

Method for fabricating a semiconductor device

Patents Applicationslast 30 patents

METHOD FOR DETERMINING DRUG-SENSITIVE HUMAN CELL LINES BY ANALYSIS...

METHOD FOR DETERMINING DRUG-SENSITIVE HUMAN CELL LINES BY ANALYSIS...

FBC MEMORY OR THYRISTOR MEMORY FOR REFRESHING UNUSED WORD LINE

TEST INSTRUMENT FOR MEASURING ANALYTE IN SAMPLE, AND METHOD FOR MEA...

METHOD OF ASSAYING COMPLEX AND KIT TO BE USED THEREFOR

NONVOLATILE MEMORY DEVICE

NONVOLATILE MEMORY DEVICE AND MANUFACTURING PROCESS THEREOF

Phase change memory device and fabrication method thereof

Nonvolatile memory device and manufacturing method for the same

Method of producing phase change memory device

Method of producing phase change memory device

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND METHOD OF PRODUCING THE SAME

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND MANUFACTURE METHOD THEREOF

Electrically rewritable non-volatile memory element and method of m...

Electrically rewritable non-volatile memory element and method of m...

Electrically rewritable non-volatile memory element and method of m...

Semiconductor device and method of producing the same

Semiconductor memory device and method of fabricating the same

Semiconductor device with high- and low-density regions of transist...