Naveen Goud Ganagona

Follow

Person

Villach, AT

People

Patents Grantslast 30 patents

Information Patent Grant
Method and assembly for determining the carbon content in silicon
- Patent number 10,317,338
- Issue date Jun 11, 2019
- Infineon Technologies AG
- Naveen Goud Ganagona
- G01 - MEASURING TESTING
Information Patent Grant
Methods for forming a semiconductor device and a semiconductor device
- Patent number 10,096,677
- Issue date Oct 9, 2018
- Infineon Technologies AG
- Moriz Jelinek
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND ASSEMBLY FOR DETERMINING THE CARBON CONTENT IN SILICON
- Publication number 20180088042
- Publication date Mar 29, 2018
- INFINEON TECHNOLOGIES AG
- Naveen Goud GANAGONA
- G01 - MEASURING TESTING
Information Patent Application
Methods for Forming a Semiconductor Device and a Semiconductor Device
- Publication number 20160372329
- Publication date Dec 22, 2016
- INFINEON TECHNOLOGIES AG
- Moriz Jelinek
- H01 - BASIC ELECTRIC ELEMENTS