Naveen Purushotham

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Embedded memory testing using back-to-back write/read operations
- Patent number 9,728,273
- Issue date Aug 8, 2017
- Lattice Semiconductor Corporation
- Kanad Chakraborty
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Embedded Memory Testing Using Back-To-Back Write/Read Operations
- Publication number 20150340103
- Publication date Nov 26, 2015
- Lattice Semiconductor Corporation
- Kanad Chakraborty
- G11 - INFORMATION STORAGE
Information Patent Application
Configurable Test Address And Data Generation For Multimode Memory...
- Publication number 20150310933
- Publication date Oct 29, 2015
- Lattice Semiconductor Corporation
- Naveen Purushotham
- G11 - INFORMATION STORAGE