Naveen Tewari

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Bengaluru, IN

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Patents Applicationslast 30 patents

Information Patent Application
DEFECT PROFILING AND TRACKING SYSTEM FOR PROCESS-MANUFACTURING ENTE...
- Publication number 20240192668
- Publication date Jun 13, 2024
- Noodle Analytics, Inc.
- Gopal Datt Joshi
- G05 - CONTROLLING REGULATING
Information Patent Application
AI-BASED DEFECT DIAGNOSIS SYSTEM AND METHOD
- Publication number 20230394492
- Publication date Dec 7, 2023
- Noodle Analytics, Inc.
- Gopal Datt JOSHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT PROFILING AND TRACKING SYSTEM FOR PROCESS-MANUFACTURING ENTE...
- Publication number 20220171374
- Publication date Jun 2, 2022
- Noodle Analytics, Inc.
- Gopal Datt Joshi
- G05 - CONTROLLING REGULATING