Navin Ghisiawan

Follow

Person

Ft. Collins, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system of modifying data in functional latches of a logi...
- Patent number 7,146,551
- Issue date Dec 5, 2006
- Hewlett-Packard Development Company, L.P.
- Navin Amar Ghisiawan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for improving testability of I/O driver/receivers
- Patent number 6,986,087
- Issue date Jan 10, 2006
- Hewlett-Packard Development Company, L.P.
- Kevin Laake
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and system of modifying data in functional latches of a logi...
- Publication number 20060161826
- Publication date Jul 20, 2006
- Navin Amar Ghisiawan
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for improving testability of I/O driver/receivers
- Publication number 20040049721
- Publication date Mar 11, 2004
- Kevin Laake
- G01 - MEASURING TESTING