Nazmul Habib

Person

South Burlington, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Heat sink configuration for multi-chip module
- Patent number 11,810,832
- Issue date Nov 7, 2023
- MARVELL ASIA PTE. LTD.
- Janak Patel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
IC chip package with dummy solder structure under corner, and relat...
- Patent number 11,682,646
- Issue date Jun 20, 2023
- MARVELL ASIA PTE. LTD.
- Manish Nayini
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
IC chip package with dummy solder structure under corner, and relat...
- Patent number 11,171,104
- Issue date Nov 9, 2021
- Marvell Asia Pte, Ltd.
- Manish Nayini
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 11,054,459
- Issue date Jul 6, 2021
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 10,996,259
- Issue date May 4, 2021
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 10,989,754
- Issue date Apr 27, 2021
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Grant
Product performance test binning
- Patent number 10,794,952
- Issue date Oct 6, 2020
- International Business Machines Corporation
- Jeanne Bickford
- G01 - MEASURING TESTING
Information Patent Grant
IC wafer for identification of circuit dies after dicing
- Patent number 10,700,013
- Issue date Jun 30, 2020
- GLOBALFOUNDRIES Inc.
- Wen Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 10,564,214
- Issue date Feb 18, 2020
- International Business Machines Corporation
- Carole D. Graas
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Integrated circuit chip reliability qualification using a sample-sp...
- Patent number 10,539,611
- Issue date Jan 21, 2020
- International Business Machines Corporation
- Jeanne P. Bickford
- G01 - MEASURING TESTING
Information Patent Grant
Methodology to prevent metal lines from current pulse damage
- Patent number 10,216,870
- Issue date Feb 26, 2019
- International Business Machines Corporation
- Jeanne P. S. Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Application of stress conditions for homogenization of stress sampl...
- Patent number 10,168,685
- Issue date Jan 1, 2019
- International Business Machines Corporation
- Mark A. Burns
- G01 - MEASURING TESTING
Information Patent Grant
Application of stress conditions for homogenization of stress sampl...
- Patent number 10,162,325
- Issue date Dec 25, 2018
- International Business Machines Corporation
- Mark A. Burns
- G05 - CONTROLLING REGULATING
Information Patent Grant
System and method for managing semiconductor manufacturing defects
- Patent number 10,089,161
- Issue date Oct 2, 2018
- International Business Machines Corporation
- Jeanne P. S. Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Product performance test binning
- Patent number 10,067,184
- Issue date Sep 4, 2018
- International Business Machines Corporation
- Theodoros Anemikos
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in power performance optimization
- Patent number 9,940,430
- Issue date Apr 10, 2018
- International Business Machines Corporation
- Jeanne P. Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit chip reliability qualification using a sample-sp...
- Patent number 9,891,275
- Issue date Feb 13, 2018
- International Business Machines Corporation
- Jeanne P. Bickford
- G05 - CONTROLLING REGULATING
Information Patent Grant
System and method for managing semiconductor manufacturing defects
- Patent number 9,880,892
- Issue date Jan 30, 2018
- International Business Machines Corporation
- Jeanne P. S. Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On-chip usable life depletion meter and associated method
- Patent number 9,791,502
- Issue date Oct 17, 2017
- GLOBALFOUNDRIES Inc.
- Jeanne P. Bickford
- G11 - INFORMATION STORAGE
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 9,739,824
- Issue date Aug 22, 2017
- International Business Machines Corporation
- Carole D. Graas
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Integrated circuit chip reliability using reliability-optimized fai...
- Patent number 9,639,645
- Issue date May 2, 2017
- GLOBALFOUNDRIES Inc.
- Jeanne P. Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for identifying operating temperatures and modify...
- Patent number 9,625,325
- Issue date Apr 18, 2017
- GLOBALFOUNDRIES Inc.
- Jeanne P. Bickford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods to prevent incorporation of a used integrated c...
- Patent number 9,618,566
- Issue date Apr 11, 2017
- GLOBALFOUNDRIES Inc.
- Jeanne P. Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scaling voltages in relation to die location
- Patent number 9,594,868
- Issue date Mar 14, 2017
- International Business Machines Corporation
- Eric A. Foreman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Application of stress conditions for homogenization of stress sampl...
- Patent number 9,506,977
- Issue date Nov 29, 2016
- International Business Machines Corporation
- Mark A. Burns
- G01 - MEASURING TESTING
Information Patent Grant
Reliability-optimized selective voltage binning
- Patent number 9,489,482
- Issue date Nov 8, 2016
- International Business Machines Corporation
- Jeanne P. Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scaling voltages in relation to die location
- Patent number 9,430,603
- Issue date Aug 30, 2016
- International Business Machines Corporation
- Eric A. Foreman
- G01 - MEASURING TESTING
Information Patent Grant
Optimization of integrated circuit reliability
- Patent number 9,395,403
- Issue date Jul 19, 2016
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Grant
System integrator and system integration method with reliability op...
- Patent number 9,354,953
- Issue date May 31, 2016
- International Business Machines Corporation
- Jeanne P. Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and circuits for generating physically unclonable function
- Patent number 9,202,554
- Issue date Dec 1, 2015
- International Business Machines Corporation
- Albert M. Chu
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
heat dissipation and electrical robustness in a three-dimensional p...
- Publication number 20230035100
- Publication date Feb 2, 2023
- Marvell Asia Pte Ltd.
- Janak G. Patel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IC CHIP PACKAGE WITH DUMMY SOLDER STRUCTURE UNDER CORNER, AND RELAT...
- Publication number 20220059488
- Publication date Feb 24, 2022
- Marvell Asia Pte, Ltd.
- Manish NAYINI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Heat Sink Configuration for Multi-Chip Module
- Publication number 20210407879
- Publication date Dec 30, 2021
- Marvell Asia Pte, Ltd.
- Janak PATEL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IC CHIP PACKAGE WITH DUMMY SOLDER STRUCTURE UNDER CORNER, AND RELAT...
- Publication number 20210125952
- Publication date Apr 29, 2021
- Marvell International Ltd.
- Manish Nayini
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20200141996
- Publication date May 7, 2020
- International Business Machines Corporation
- Carole D. Graas
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20200072897
- Publication date Mar 5, 2020
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
IC WAFER FOR IDENTIFICATION OF CIRCUIT DIES AFTER DICING
- Publication number 20190214348
- Publication date Jul 11, 2019
- GLOBALFOUNDRIES INC.
- Wen Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRODUCT PERFORMANCE TEST BINNING
- Publication number 20180292456
- Publication date Oct 11, 2018
- International Business Machines Corporation
- Jeanne Bickford
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20180074114
- Publication date Mar 15, 2018
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MANAGING SEMICONDUCTOR MANUFACTURING DEFECTS
- Publication number 20180074874
- Publication date Mar 15, 2018
- International Business Machines Corporation
- Jeanne P. S. Bickford
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT CHIP RELIABILITY QUALIFICATION USING A SAMPLE-SP...
- Publication number 20180052201
- Publication date Feb 22, 2018
- International Business Machines Corporation
- Jeanne P. Bickford
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20170285094
- Publication date Oct 5, 2017
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
RESISTANCE MEASUREMENT-DEPENDENT INTEGRATED CIRCUIT CHIP RELIABILIT...
- Publication number 20170212165
- Publication date Jul 27, 2017
- GLOBALFOUNDRIES INC.
- Jeanne P. Bickford
- G01 - MEASURING TESTING
Information Patent Application
METHODOLOGY TO PREVENT METAL LINES FROM CURRENT PULSE DAMAGE
- Publication number 20170199949
- Publication date Jul 13, 2017
- International Business Machines Corporation
- JEANNE P. S. BICKFORD
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BURN-IN POWER PERFORMANCE OPTIMIZATION
- Publication number 20170161426
- Publication date Jun 8, 2017
- International Business Machines Corporation
- Jeanne P. Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPLICATION OF STRESS CONDITIONS FOR HOMOGENIZATION OF STRESS SAMPL...
- Publication number 20170023640
- Publication date Jan 26, 2017
- International Business Machines Corporation
- Mark A. Burns
- G01 - MEASURING TESTING
Information Patent Application
APPLICATION OF STRESS CONDITIONS FOR HOMOGENIZATION OF STRESS SAMPL...
- Publication number 20170023924
- Publication date Jan 26, 2017
- International Business Machines Corporation
- Mark A. Burns
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT CHIP RELIABILITY QUALIFICATION USING A SAMPLE-SP...
- Publication number 20160377674
- Publication date Dec 29, 2016
- International Business Machines Corporation
- Jeanne P. Bickford
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT CHIP RELIABILITY USING RELIABILITY-OPTIMIZED FAI...
- Publication number 20160371413
- Publication date Dec 22, 2016
- International Business Machines Corporation
- Jeanne P. Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ON-CHIP USABLE LIFE DEPLETION METER AND ASSOCIATED METHOD
- Publication number 20160320214
- Publication date Nov 3, 2016
- International Business Machines Corporation
- Jeanne P. Bickford
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20160258994
- Publication date Sep 8, 2016
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS TO PREVENT INCORPORATION OF A USED INTEGRATED C...
- Publication number 20160238653
- Publication date Aug 18, 2016
- International Business Machines Corporation
- Jeanne P. Bickford
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR IDENTIFYING OPERATING TEMPERATURES AND MODIFY...
- Publication number 20160240479
- Publication date Aug 18, 2016
- GLOBALFOUNDRIES INC.
- Jeanne P. Bickford
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM INTEGRATOR AND SYSTEM INTEGRATION METHOD WITH RELIABILITY OP...
- Publication number 20160026517
- Publication date Jan 28, 2016
- International Business Machines Corporation
- Jeanne P. Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
UPDATING RELIABILITY PREDICTIONS USING MANUFACTURING ASSESSMENT DATA
- Publication number 20160019328
- Publication date Jan 21, 2016
- International Business Machines Corporation
- Jeanne P. Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND CIRCUITS FOR GENERATING PHYSICALLY UNCLONABLE FUNCTION
- Publication number 20150262653
- Publication date Sep 17, 2015
- International Business Machines Corporation
- Albert M. Chu
- G11 - INFORMATION STORAGE
Information Patent Application
APPLICATION OF STRESS CONDITIONS FOR HOMOGENIZATION OF STRESS SAMPL...
- Publication number 20150253376
- Publication date Sep 10, 2015
- International Business Machines Corporation
- Mark A. Burns
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MANAGING SEMICONDUCTOR MANUFACTURING DEFECTS
- Publication number 20150241511
- Publication date Aug 27, 2015
- International Business Machines Corporation
- Jeanne P.S. Bickford
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY
- Publication number 20150115994
- Publication date Apr 30, 2015
- International Business Machines Corporation
- Carole D. Graas
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE RELIABILITY MODEL AND METHODOLOGIES FOR USE TH...
- Publication number 20150106780
- Publication date Apr 16, 2015
- International Business Machines Corporation
- Jeanne P. BICKFORD
- G06 - COMPUTING CALCULATING COUNTING

Nazmul Habib

Person

Patents Grantslast 30 patents

Heat sink configuration for multi-chip module

IC chip package with dummy solder structure under corner, and relat...

IC chip package with dummy solder structure under corner, and relat...

Optimization of integrated circuit reliability

Optimization of integrated circuit reliability

Optimization of integrated circuit reliability

Product performance test binning

IC wafer for identification of circuit dies after dicing

Optimization of integrated circuit reliability

Integrated circuit chip reliability qualification using a sample-sp...

Methodology to prevent metal lines from current pulse damage

Application of stress conditions for homogenization of stress sampl...

Application of stress conditions for homogenization of stress sampl...

System and method for managing semiconductor manufacturing defects

Product performance test binning

Burn-in power performance optimization

Integrated circuit chip reliability qualification using a sample-sp...

System and method for managing semiconductor manufacturing defects

On-chip usable life depletion meter and associated method

Optimization of integrated circuit reliability

Integrated circuit chip reliability using reliability-optimized fai...

System and method for identifying operating temperatures and modify...

Systems and methods to prevent incorporation of a used integrated c...

Scaling voltages in relation to die location

Application of stress conditions for homogenization of stress sampl...

Reliability-optimized selective voltage binning

Scaling voltages in relation to die location

Optimization of integrated circuit reliability

System integrator and system integration method with reliability op...

Methods and circuits for generating physically unclonable function

Patents Applicationslast 30 patents

heat dissipation and electrical robustness in a three-dimensional p...

IC CHIP PACKAGE WITH DUMMY SOLDER STRUCTURE UNDER CORNER, AND RELAT...

Heat Sink Configuration for Multi-Chip Module

IC CHIP PACKAGE WITH DUMMY SOLDER STRUCTURE UNDER CORNER, AND RELAT...

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

IC WAFER FOR IDENTIFICATION OF CIRCUIT DIES AFTER DICING

PRODUCT PERFORMANCE TEST BINNING

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

SYSTEM AND METHOD FOR MANAGING SEMICONDUCTOR MANUFACTURING DEFECTS

INTEGRATED CIRCUIT CHIP RELIABILITY QUALIFICATION USING A SAMPLE-SP...

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

RESISTANCE MEASUREMENT-DEPENDENT INTEGRATED CIRCUIT CHIP RELIABILIT...

METHODOLOGY TO PREVENT METAL LINES FROM CURRENT PULSE DAMAGE

BURN-IN POWER PERFORMANCE OPTIMIZATION

APPLICATION OF STRESS CONDITIONS FOR HOMOGENIZATION OF STRESS SAMPL...

APPLICATION OF STRESS CONDITIONS FOR HOMOGENIZATION OF STRESS SAMPL...

INTEGRATED CIRCUIT CHIP RELIABILITY QUALIFICATION USING A SAMPLE-SP...

INTEGRATED CIRCUIT CHIP RELIABILITY USING RELIABILITY-OPTIMIZED FAI...

ON-CHIP USABLE LIFE DEPLETION METER AND ASSOCIATED METHOD

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

SYSTEMS AND METHODS TO PREVENT INCORPORATION OF A USED INTEGRATED C...

SYSTEM AND METHOD FOR IDENTIFYING OPERATING TEMPERATURES AND MODIFY...

SYSTEM INTEGRATOR AND SYSTEM INTEGRATION METHOD WITH RELIABILITY OP...

UPDATING RELIABILITY PREDICTIONS USING MANUFACTURING ASSESSMENT DATA

METHODS AND CIRCUITS FOR GENERATING PHYSICALLY UNCLONABLE FUNCTION

APPLICATION OF STRESS CONDITIONS FOR HOMOGENIZATION OF STRESS SAMPL...

SYSTEM AND METHOD FOR MANAGING SEMICONDUCTOR MANUFACTURING DEFECTS

OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY

SEMICONDUCTOR DEVICE RELIABILITY MODEL AND METHODOLOGIES FOR USE TH...