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Neal C. Jaarsma
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Corvallis, OR, US
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Patents Grants
last 30 patents
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Patent Grant
Method and apparatus for on-chip adjustment of chip characteristics
Patent number
9,766,966
Issue date
Sep 19, 2017
Marvell International Ltd.
Neal C. Jaarsma
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for authenticating a semiconductor die
Patent number
9,443,733
Issue date
Sep 13, 2016
Marvell World Trade Ltd.
Patrick A. McKinley
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and apparatus for on-chip adjustment of chip characteristics
Patent number
8,159,241
Issue date
Apr 17, 2012
Marvell International Ltd.
Neal C. Jaarsma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Hierarchical creation of vectors for quiescent current (IDDQ) tests...
Patent number
6,751,768
Issue date
Jun 15, 2004
Agilent Technologies, Inc.
Fidel Muradali
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit with scan test structure
Patent number
6,587,981
Issue date
Jul 1, 2003
Agilent Technologies, Inc.
Fidel Muradali
G01 - MEASURING TESTING
Information
Patent Grant
Serial and parallel scan technique for improved testing of systolic...
Patent number
5,130,989
Issue date
Jul 14, 1992
Hewlett-Packard Company
Daryl E. Anderson
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Method and Apparatus for Authenticating a Semiconductor Die
Publication number
20150123702
Publication date
May 7, 2015
Marvell World Trade Ltd.
Patrick A. McKinley
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Hierarchical creation of vectors for quiescent current (IDDQ) tests...
Publication number
20030101398
Publication date
May 29, 2003
Fidel Muradali
G01 - MEASURING TESTING