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Neal J. Brock
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Tucson, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Interferometry with pixelated color discriminating elements combine...
Patent number
11,353,316
Issue date
Jun 7, 2022
Onto Innovation Inc.
Neal Brock
G01 - MEASURING TESTING
Information
Patent Grant
Single snap-shot fringe projection system
Patent number
9,958,251
Issue date
May 1, 2018
AD TECHNOLOGY CORPORATION
Neal Brock
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for splitting, imaging, and measuring wavefro...
Patent number
7,298,497
Issue date
Nov 20, 2007
MetroLaser, Inc.
James E. Millerd
G01 - MEASURING TESTING
Information
Patent Grant
Pixelated phase-mask interferometer
Patent number
7,230,717
Issue date
Jun 12, 2007
4D Technology Corporation
Neal J. Brock
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for splitting, imaging, and measuring wavefro...
Patent number
7,170,611
Issue date
Jan 30, 2007
MetroLaser, Inc.
James E. Millerd
G01 - MEASURING TESTING
Information
Patent Grant
Calibration and error correction in multi-channel imaging
Patent number
7,079,251
Issue date
Jul 18, 2006
4D Technology Corporation
James E. Millerd
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Common optical-path testing of high-numerical-aperture wavefronts
Patent number
7,057,737
Issue date
Jun 6, 2006
4D Technology Corporation
James E. Millerd
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for splitting, imaging, and measuring wavefro...
Patent number
6,552,808
Issue date
Apr 22, 2003
MetroLaser, Inc.
James E. Millerd
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for splitting, imaging, and measuring wavefro...
Patent number
6,304,330
Issue date
Oct 16, 2001
MetroLaser, Inc.
James E. Millerd
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Methods and apparatus for splitting, imaging, and measuring wavefro...
Publication number
20060132795
Publication date
Jun 22, 2006
James E. Millerd
G01 - MEASURING TESTING
Information
Patent Application
Calibration and error correction in multi-channel imaging
Publication number
20050083531
Publication date
Apr 21, 2005
James E. Millerd
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Common optical-path testing of high-numerical-aperture wavefronts
Publication number
20050046863
Publication date
Mar 3, 2005
James E. Millerd
G01 - MEASURING TESTING
Information
Patent Application
Pixelated phase-mask interferometer
Publication number
20050046865
Publication date
Mar 3, 2005
Neal J. Brock
G01 - MEASURING TESTING
Information
Patent Application
Methods and apparatus for splitting, imaging, and measuring wavefro...
Publication number
20030053071
Publication date
Mar 20, 2003
Millerd E. James
G01 - MEASURING TESTING
Information
Patent Application
Methods and apparatus for splitting, imaging, and measuring wavefro...
Publication number
20020003628
Publication date
Jan 10, 2002
Millerd E. James
G01 - MEASURING TESTING