Ned R. Saleh

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Automated hybrid metrology for semiconductor device fabrication
- Patent number 9,330,985
- Issue date May 3, 2016
- GLOBALFOUNDRIES, INC.
- Alok Vaid
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATED HYBRID METROLOGY FOR SEMICONDUCTOR DEVICE FABRICATION
- Publication number 20130245806
- Publication date Sep 19, 2013
- International Business Machines Corporation
- Alok Vaid
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HYBRID METROLOGY FOR SEMICONDUCTOR DEVICES
- Publication number 20130203188
- Publication date Aug 8, 2013
- GLOBALFOUNDRIES INC.
- Alok Vaid
- G01 - MEASURING TESTING