Nedal R. Saleh

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Scatterometry measurement of line edge roughness in the bright field
- Patent number 9,091,942
- Issue date Jul 28, 2015
- International Business Machines Corporation
- Nedal R. Saleh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Automating integrated circuit device library generation in model ba...
- Patent number 8,869,081
- Issue date Oct 21, 2014
- International Business Machines Corporation
- Nedal Saleh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spectrometry employing extinction coefficient modulation
- Patent number 8,860,956
- Issue date Oct 14, 2014
- International Business Machines Corporation
- Nedal R. Saleh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPLICATION OF eBIP TO INSPECTION, TEST, DEBUG AND SURFACE MODIFICA...
- Publication number 20170294291
- Publication date Oct 12, 2017
- ORBOTECH LTD.
- Nedal SALEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPLICATION OF ELECTRON-BEAM INDUCED PLASMA PROBES TO INSPECTION, T...
- Publication number 20160299103
- Publication date Oct 13, 2016
- Photon Dynamics Inc.
- Nedal Saleh
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRY EMPLOYING EXTINCTION COEFFICIENT MODULATION
- Publication number 20140268181
- Publication date Sep 18, 2014
- International Business Machines Corporation
- Nedal R. Saleh
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATING INTEGRATED CIRCUIT DEVICE LIBRARY GENERATION IN MODEL BA...
- Publication number 20140201693
- Publication date Jul 17, 2014
- GLOBALFOUNDRIES INC.
- Nedal Saleh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-SITU ACTIVE WAFER CHARGE SCREENING BY CONFORMAL GROUNDING
- Publication number 20140073114
- Publication date Mar 13, 2014
- GLOBALFOUNDRIES INC.
- Cheng Cen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-SITU ACTIVE WAFER CHARGE SCREENING BY CONFORMAL GROUNDING
- Publication number 20130200501
- Publication date Aug 8, 2013
- GLOBALFOUNDRIES INC.
- Cheng Cen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCATTEROMETRY MEASUREMENT OF LINE EDGE ROUGHNESS IN THE BRIGHT FIELD
- Publication number 20130132036
- Publication date May 23, 2013
- International Business Machines Corporation
- Nedal R. Saleh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Nedal R. Saleh

Person

Patents Grantslast 30 patents

Scatterometry measurement of line edge roughness in the bright field

Automating integrated circuit device library generation in model ba...

Spectrometry employing extinction coefficient modulation

Patents Applicationslast 30 patents

APPLICATION OF eBIP TO INSPECTION, TEST, DEBUG AND SURFACE MODIFICA...

APPLICATION OF ELECTRON-BEAM INDUCED PLASMA PROBES TO INSPECTION, T...

SPECTROMETRY EMPLOYING EXTINCTION COEFFICIENT MODULATION

AUTOMATING INTEGRATED CIRCUIT DEVICE LIBRARY GENERATION IN MODEL BA...

IN-SITU ACTIVE WAFER CHARGE SCREENING BY CONFORMAL GROUNDING

IN-SITU ACTIVE WAFER CHARGE SCREENING BY CONFORMAL GROUNDING

SCATTEROMETRY MEASUREMENT OF LINE EDGE ROUGHNESS IN THE BRIGHT FIELD