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Nee Wan Khoo
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Melaka, MY
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Patents Grants
last 30 patents
Information
Patent Grant
Protector cap for package with thermal interface material
Patent number
12,211,761
Issue date
Jan 28, 2025
Infineon Technologies Austria AG
Christian Kasztelan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Protector cap for package with thermal interface material
Patent number
11,769,701
Issue date
Sep 26, 2023
Infineon Technologies Austria AG
Christian Kasztelan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for dynamic alignment of semiconductor devices
Patent number
10,041,973
Issue date
Aug 7, 2018
Infineon Technologies AG
Nee Wan Khoo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of electrically isolating leads of a lead frame strip by las...
Patent number
9,754,834
Issue date
Sep 5, 2017
Infineon Technologies AG
Nee Wan Khoo
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Turret handlers and methods of operations thereof
Patent number
9,594,111
Issue date
Mar 14, 2017
Infineon Technologies AG
Theng Chao Long
G01 - MEASURING TESTING
Information
Patent Grant
Method of electrically isolating leads of a lead frame strip
Patent number
9,437,458
Issue date
Sep 6, 2016
Infineon Technologies AG
Nee Wan Khoo
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Turret handlers and methods of operations thereof
Patent number
9,274,163
Issue date
Mar 1, 2016
Infineon Technologies AG
Theng Chao Long
G01 - MEASURING TESTING
Information
Patent Grant
Lead frame strips with electrical isolation of die paddles
Patent number
9,263,419
Issue date
Feb 16, 2016
Infineon Technologies AG
Nee Wan Khoo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Extended contact area for leadframe strip testing
Patent number
9,252,063
Issue date
Feb 2, 2016
Infineon Technologies AG
Nee Wan Khoo
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Semiconductor Device Testing with Lead Extender
Publication number
20240302426
Publication date
Sep 12, 2024
INFINEON TECHNOLOGIES AG
Soon Lai Kho
G01 - MEASURING TESTING
Information
Patent Application
Protector Cap for Package with Thermal Interface Material
Publication number
20230395442
Publication date
Dec 7, 2023
Infineon Technologies Austria AG
Christian Kasztelan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS FOR TESTING SEMICONDUCTOR DEVICES AND A ROLLING CONTACTOR...
Publication number
20230314502
Publication date
Oct 5, 2023
INFINEON TECHNOLOGIES AG
Nee Wan KHOO
G01 - MEASURING TESTING
Information
Patent Application
Protector Cap for Package with Thermal Interface Material
Publication number
20210272861
Publication date
Sep 2, 2021
Christian Kasztelan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of Electrically Isolating Leads of a Lead Frame Strip by Las...
Publication number
20160372374
Publication date
Dec 22, 2016
INFINEON TECHNOLOGIES AG
Nee Wan Khoo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
EXTENDED CONTACT AREA FOR LEADFRAME STRIP TESTING
Publication number
20160005663
Publication date
Jan 7, 2016
INFINEON TECHNOLOGIES AG
Nee Wan Khoo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of Electrically Isolating Leads of a Lead Frame Strip
Publication number
20150132868
Publication date
May 14, 2015
INFINEON TECHNOLOGIES AG
Nee Wan Khoo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Lead Frame Strips with Electrical Isolation of Die Paddles
Publication number
20150064849
Publication date
Mar 5, 2015
INFINEON TECHNOLOGIES AG
Nee Wan Khoo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and Apparatus for Dynamic Alignment of Semiconductor Devices
Publication number
20150063969
Publication date
Mar 5, 2015
INFINEON TECHNOLOGIES AG
Nee Wan Khoo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Turret Handlers and Methods of Operations Thereof
Publication number
20140239998
Publication date
Aug 28, 2014
INFINEON TECHNOLOGIES AG
Theng Chao Long
G01 - MEASURING TESTING