Neel Leslie

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Alignment of CAD data to images in high resolution optical fault an...
- Patent number 10,282,510
- Issue date May 7, 2019
- FEI Company
- Tenzile Berkin Cilingiroglu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Waveform mapping and gated laser voltage imaging
- Patent number 10,209,301
- Issue date Feb 19, 2019
- FEI Company
- Christopher Nemirow
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
TECHNIQUES FOR WAVEFORM DETECTION OF PERIODIC SIGNALS USING VOLTAGE...
- Publication number 20250069842
- Publication date Feb 27, 2025
- FEI Company
- Neel Leslie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TECHNIQUES FOR IMAGING LOW DUTY CYCLE SIGNALS USING A SCANNING ELEC...
- Publication number 20250069845
- Publication date Feb 27, 2025
- FEI Company
- Neel Leslie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAVEFORM SEPARATION FOR RESOLUTION LIMITED OPTICAL PROBING TOOLS
- Publication number 20200333394
- Publication date Oct 22, 2020
- FEI Company
- Tenzile Berkin Cilingiroglu
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT OF CAD DATA TO IMAGES IN HIGH RESOLUTION OPTICAL FAULT AN...
- Publication number 20180293346
- Publication date Oct 11, 2018
- FEI Company
- Tenzile Berkin Cilingiroglu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Waveform Mapping and Gated Laser Voltage Imaging
- Publication number 20170131349
- Publication date May 11, 2017
- FEI Company
- Christopher Nemirow
- G02 - OPTICS