Neeti Vohra

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Pattern inspection apparatus and method
- Patent number 8,045,785
- Issue date Oct 25, 2011
- NGR Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus and method
- Patent number 7,817,844
- Issue date Oct 19, 2010
- Nanogeometry Research Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus and method
- Patent number 7,796,801
- Issue date Sep 14, 2010
- Nanogeometry Research Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PATTERN INSPECTION APPARATUS AND METHOD
- Publication number 20100303334
- Publication date Dec 2, 2010
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern inspection apparatus and method
- Publication number 20060245636
- Publication date Nov 2, 2006
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern inspection apparatus and method
- Publication number 20050146714
- Publication date Jul 7, 2005
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING