Nehal Patel

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for enabling debugging
- Patent number 12,181,955
- Issue date Dec 31, 2024
- Advanced Micro Devices, Inc.
- Lu Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Low power and high speed scan dump
- Patent number 12,135,577
- Issue date Nov 5, 2024
- Advanced Micro Devices, Inc.
- Nehal Patel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chip debug during power gating events
- Patent number 9,377,506
- Issue date Jun 28, 2016
- Advanced Micro Devices, Inc.
- Shantanu Sarangi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Chip Self-Repair for Interconnect Short Faults
- Publication number 20250216456
- Publication date Jul 3, 2025
- ADVANCED MICRO DEVICES, INC.
- Nehal R. Patel
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, SYSTEM, AND METHOD FOR INTERFACING DIES THAT USE INCOMPA...
- Publication number 20250217246
- Publication date Jul 3, 2025
- ADVANCED MICRO DEVICES, INC.
- Robert Landon Pelt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INCREASED SHIFT FREQUENCY FOR MULTI-CHIP-MODULE SCAN
- Publication number 20250208779
- Publication date Jun 26, 2025
- ADVANCED MICRO DEVICES, INC.
- Nehal Patel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING MULTI-CYCLE PATHS BASED ON CLOCK PATTERN
- Publication number 20250102570
- Publication date Mar 27, 2025
- ADVANCED MICRO DEVICES, INC.
- Nehal Patel
- G01 - MEASURING TESTING
Information Patent Application
HOST-TO-DEVICE INTERFACE CIRCUITRY TESTING
- Publication number 20250006290
- Publication date Jan 2, 2025
- ADVANCED MICRO DEVICES, INC.
- Nehal Patel
- G11 - INFORMATION STORAGE
Information Patent Application
LOW POWER AND HIGH SPEED SCAN DUMP
- Publication number 20240168513
- Publication date May 23, 2024
- ADVANCED MICRO DEVICES, INC.
- Nehal Patel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHIP DEBUG DURING POWER GATING EVENTS
- Publication number 20150276868
- Publication date Oct 1, 2015
- Advanced Micro Devices, Inc.
- Shantanu SARANGI
- G01 - MEASURING TESTING

Nehal Patel

Person

Patents Grantslast 30 patents

Systems and methods for enabling debugging

Low power and high speed scan dump

Chip debug during power gating events

Patents Applicationslast 30 patents

Chip Self-Repair for Interconnect Short Faults

APPARATUS, SYSTEM, AND METHOD FOR INTERFACING DIES THAT USE INCOMPA...

INCREASED SHIFT FREQUENCY FOR MULTI-CHIP-MODULE SCAN

TESTING MULTI-CYCLE PATHS BASED ON CLOCK PATTERN

HOST-TO-DEVICE INTERFACE CIRCUITRY TESTING

LOW POWER AND HIGH SPEED SCAN DUMP

CHIP DEBUG DURING POWER GATING EVENTS