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Neil J. Goldfine
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Newton, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
System and method for hole inspection
Patent number
12,061,169
Issue date
Aug 13, 2024
JENTEK Sensors, Inc.
Todd Dunford
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measurement of material condition
Patent number
11,959,880
Issue date
Apr 16, 2024
JENTEK Sensors, Inc.
Scott A Denenberg
G01 - MEASURING TESTING
Information
Patent Grant
Measurement system and method of use
Patent number
11,841,245
Issue date
Dec 12, 2023
JENTEK Sensors, Inc.
Neil J Goldfine
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Segmented field eddy current sensing for dispersive property measur...
Patent number
11,802,851
Issue date
Oct 31, 2023
JENTEK Sensors, Inc.
Neil J Goldfine
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
In-process quality assessment for additive manufacturing
Patent number
11,747,304
Issue date
Sep 5, 2023
JENTEK Sensors, Inc.
Neil J Goldfine
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Measurement system and method of use
Patent number
11,549,831
Issue date
Jan 10, 2023
JENTEK Sensors, Inc.
Neil J Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
In-process quality assessment for additive manufacturing
Patent number
11,543,388
Issue date
Jan 3, 2023
JENTEK Sensors, Inc.
Neil J Goldfine
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Complex part inspection with eddy current sensors
Patent number
11,435,317
Issue date
Sep 6, 2022
JENTEK Sensors, Inc.
Neil J Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Segmented field eddy current sensing for dispersive property measur...
Patent number
11,268,931
Issue date
Mar 8, 2022
JENTEK Sensors, Inc.
Neil J Goldfine
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
In-process quality assessment for additive manufacturing
Patent number
11,268,933
Issue date
Mar 8, 2022
Jentek Sensors, Inc.
Neil J. Goldfine
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Method and apparatus for measurement of material condition
Patent number
11,092,571
Issue date
Aug 17, 2021
JENTEK Sensors, Inc.
Scott A Denenberg
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for inspection of corrosion and other defects...
Patent number
10,732,096
Issue date
Aug 4, 2020
Jentek Sensors, Inc.
Scott A. Denenberg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated sensor cartridge system and method of use
Patent number
10,677,756
Issue date
Jun 9, 2020
Jentek Sensors, Inc.
Neil J Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for non-destructive evaluation of materials
Patent number
10,444,189
Issue date
Oct 15, 2019
JENTEK Sensors, Inc.
Neil J Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Measurement system and method of use
Patent number
10,416,118
Issue date
Sep 17, 2019
JENTEK Sensors, Inc.
Neil J Goldfine
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Portable test instrument
Patent number
D857534
Issue date
Aug 27, 2019
JENTEK Sensors, Inc.
Todd M Dunford
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Method and apparatus for measurement of material condition
Patent number
10,324,062
Issue date
Jun 18, 2019
JENTEK Sensors, Inc.
Scott A Denenberg
G01 - MEASURING TESTING
Information
Patent Grant
Portable test instrument attachment
Patent number
D842725
Issue date
Mar 12, 2019
Todd M Dunford
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Portable test instrument
Patent number
D830863
Issue date
Oct 16, 2018
Todd M Dunford
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Performance curve generation for non-destructive testing sensors
Patent number
10,001,457
Issue date
Jun 19, 2018
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for inspection of corrosion and other defects...
Patent number
9,823,179
Issue date
Nov 21, 2017
Jentek Sensors, Inc.
Scott A. Denenberg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for non-destructive evaluation of materials
Patent number
9,772,309
Issue date
Sep 26, 2017
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Durability enhanced and redundant embedded sensors
Patent number
9,279,784
Issue date
Mar 8, 2016
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for inspection of corrosion and other defects...
Patent number
9,255,875
Issue date
Feb 9, 2016
Jentek Sensors, Inc.
Scott A. Denenberg
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for load and additional property measurement
Patent number
9,207,131
Issue date
Dec 8, 2015
Jentek Sensors, Inc.
Darrell E. Schlicker
G01 - MEASURING TESTING
Information
Patent Grant
Internal material condition monitoring for control
Patent number
8,981,018
Issue date
Mar 17, 2015
Jentek Sensors, Inc.
Neil J. Goldfine
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method and apparatus for detection and characterization of mechanic...
Patent number
8,960,012
Issue date
Feb 24, 2015
Jentek Sensors, Inc.
Todd M. Dunford
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for non-destructive evaluation of materials
Patent number
8,928,316
Issue date
Jan 6, 2015
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Durability enhanced and redundant embedded sensors
Patent number
8,803,515
Issue date
Aug 12, 2014
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Remaining life prediction for individual components from sparse data
Patent number
8,768,657
Issue date
Jul 1, 2014
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Scanning System and Method for Axial Symmetric Test Objects
Publication number
20240377360
Publication date
Nov 14, 2024
JENTEK Sensors, Inc.
Todd M Dunford
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT SYSTEM AND METHOD OF USE
Publication number
20240255323
Publication date
Aug 1, 2024
JENTEK Sensors, Inc.
Neil J Goldfine
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
In-Process Quality Assessment for Additive Manufacturing
Publication number
20230408449
Publication date
Dec 21, 2023
JENTEK Sensors, Inc.
Neil J Goldfine
B22 - CASTING POWDER METALLURGY
Information
Patent Application
MEASUREMENT SYSTEM AND METHOD OF USE
Publication number
20230160728
Publication date
May 25, 2023
JENTEK Sensors, Inc.
Neil J Goldfine
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
In-Process Quality Assessment for Additive Manufacturing
Publication number
20230152278
Publication date
May 18, 2023
JENTEK Sensors, Inc.
Neil J Goldfine
B22 - CASTING POWDER METALLURGY
Information
Patent Application
SEGMENTED FIELD EDDY CURRENT SENSING FOR DISPERSIVE PROPERTY MEASUR...
Publication number
20230095662
Publication date
Mar 30, 2023
JENTEK Sensors, Inc.
Neil J. Goldfine
B22 - CASTING POWDER METALLURGY
Information
Patent Application
COMPLEX PART INSPECTION WITH EDDY CURRENT SENSORS
Publication number
20220412918
Publication date
Dec 29, 2022
JENTEK Sensors, Inc.
Neil J Goldfine
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT SYSTEM AND METHOD OF USE
Publication number
20220373367
Publication date
Nov 24, 2022
JENTEK Sensors, Inc.
Neil J Goldfine
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SYSTEM AND METHOD FOR PIT DETECTION AND SIZING
Publication number
20220358630
Publication date
Nov 10, 2022
JENTEK Sensors, Inc.
Neil J. Goldfine
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR HOLE INSPECTION
Publication number
20220341876
Publication date
Oct 27, 2022
JENTEK Sensors, Inc.
Todd Dunford
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR HOLE INSPECTION AND QUALIFICATION
Publication number
20220341875
Publication date
Oct 27, 2022
JENTEK Sensors, Inc.
Stuart Chaplan
G01 - MEASURING TESTING
Information
Patent Application
In-Process Quality Assessment for Additive Manufacturing
Publication number
20220178877
Publication date
Jun 9, 2022
JENTEK Sensors, Inc.
Neil J Goldfine
B22 - CASTING POWDER METALLURGY
Information
Patent Application
Method and Apparatus for Measurement of Material Condition
Publication number
20210372968
Publication date
Dec 2, 2021
JENTEK Sensors, Inc.
Scott A. Denenberg
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT SYSTEM AND METHOD OF USE
Publication number
20210080297
Publication date
Mar 18, 2021
JENTEK Sensors, Inc.
Neil J Goldfine
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
COMPLEX PART INSPECTION WITH EDDY CURRENT SENSORS
Publication number
20210055262
Publication date
Feb 25, 2021
JENTEK Sensors, Inc.
Neil J Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Segmented Field Eddy Current Sensing for Dispersive Property Measur...
Publication number
20190383771
Publication date
Dec 19, 2019
JENTEK Sensors, Inc.
Neil J. Goldfine
B22 - CASTING POWDER METALLURGY
Information
Patent Application
Method and Apparatus for Measurement of Material Condition
Publication number
20190323992
Publication date
Oct 24, 2019
JENTEK Sensors, Inc.
Scott A. Denenberg
G01 - MEASURING TESTING
Information
Patent Application
IN SITU ADDITIVE MANUFACTURING PROCESS SENSING AND CONTROL INCLUDIN...
Publication number
20180264590
Publication date
Sep 20, 2018
JENTEK Sensors, Inc.
Neil J. Goldfine
B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information
Patent Application
Method And Apparatus For Inspection Of Corrosion And Other Defects...
Publication number
20180209894
Publication date
Jul 26, 2018
JENTEK Sensors, Inc.
Scott A. Denenberg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
In-Process Quality Assessment for Additive Manufacturing
Publication number
20180120260
Publication date
May 3, 2018
JENTEK Sensors, Inc.
Neil J. Goldfine
B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information
Patent Application
METHOD AND APPARATUS FOR NON-DESTRUCTIVE EVALUATION OF MATERIALS
Publication number
20170315095
Publication date
Nov 2, 2017
JENTEK Sensors, Inc.
Neil J Goldfine
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED SENSOR CARTRIDGE SYSTEM AND METHOD OF USE
Publication number
20160349214
Publication date
Dec 1, 2016
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Measurement of Material Condition
Publication number
20160274060
Publication date
Sep 22, 2016
JENTEK Sensors, Inc.
Scott A Denenberg
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR INSPECTION OF CORROSION AND OTHER DEFECTS...
Publication number
20160238514
Publication date
Aug 18, 2016
JENTEK Sensors, Inc.
Scott A. Denenberg
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Non-Destructive Evaluation of Materials
Publication number
20150212044
Publication date
Jul 30, 2015
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
INTERNAL MATERIAL CONDITION MONITORING FOR CONTROL
Publication number
20150160144
Publication date
Jun 11, 2015
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Durability Enhanced And Redundant Embedded Sensors
Publication number
20150145510
Publication date
May 28, 2015
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Detection and Characterization of Mechanic...
Publication number
20140182389
Publication date
Jul 3, 2014
JENTEK Sensors, Inc.
Todd M. Dunford
G01 - MEASURING TESTING
Information
Patent Application
Method And Apparatus For Load And Additional Property Measurement
Publication number
20130269450
Publication date
Oct 17, 2013
Darrell E. Schlicker
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Inspection of Corrosion and Other Defects...
Publication number
20130124109
Publication date
May 16, 2013
JENTEK Sensors, Inc.
Scott A. Denenberg
G01 - MEASURING TESTING