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Nestor J. Zaluzec
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Bolingbrook, IL, US
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Patents Grants
last 30 patents
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Patent Grant
High collection efficiency X-ray spectrometer system with integrate...
Patent number
8,314,386
Issue date
Nov 20, 2012
UChicago Argonne, LLC
Nestor J. Zaluzec
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Scanning confocal electron microscope
Patent number
6,548,810
Issue date
Apr 15, 2003
The University of Chicago
Nestor J. Zaluzec
G01 - MEASURING TESTING
Information
Patent Grant
Simultaneous specimen and stage cleaning device for analytical elec...
Patent number
5,510,624
Issue date
Apr 23, 1996
The University of Chicago
Nestor J. Zaluzec
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
HIGH COLLECTION EFFICIENCY X-RAY SPECTROMETER SYSTEM WITH INTEGRATE...
Publication number
20120160999
Publication date
Jun 28, 2012
UChicago Argonne, LLC
Nestor J. Zaluzec
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Scanning confocal electron microscope
Publication number
20030025075
Publication date
Feb 6, 2003
The University of Chicago
Nestor J. Zaluzec
G01 - MEASURING TESTING