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Netanel LINDNER
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Aviel, IL
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last 30 patents
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Patent Grant
Far-infrared detection using Weyl semimetals
Patent number
10,090,466
Issue date
Oct 2, 2018
Massachusetts Institute of Technology
Ching-Kit Chan
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHODS AND SYSTEMS FOR PATCH-BY-PATCH CHARACTERIZATION OF QUANTOM...
Publication number
20240046131
Publication date
Feb 8, 2024
Dorit Aharonov
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
OPTICAL CIRCUITS FOR PURIFICATION OF SINGLE PHOTON STATES
Publication number
20230206106
Publication date
Jun 29, 2023
California Institute of Technology
Netanel H. Lindner
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
FAR-INFRARED DETECTION USING WEYL SEMIMETALS
Publication number
20180026185
Publication date
Jan 25, 2018
Massachusetts Institute of Technology
Ching-Kit CHAN
G01 - MEASURING TESTING