Nghi Phan

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Santa Barbara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope with compact scanner
- Patent number 8,474,060
- Issue date Jun 25, 2013
- Bruker Nano, Inc.
- Nghi Phan
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fast-scanning SPM scanner and method of operating same
- Patent number 8,443,459
- Issue date May 14, 2013
- Bruker Nano, Inc.
- Nghi Phan
- G01 - MEASURING TESTING
Information Patent Grant
Fast-scanning SPM scanner and method of operating same
- Patent number 8,166,567
- Issue date Apr 24, 2012
- Bruker Nano, Inc.
- Nghi Phan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for obtaining quantitative measurements using...
- Patent number 8,161,805
- Issue date Apr 24, 2012
- Bruker Nano, Inc.
- Chanmin Su
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fast-scanning SPM and method of operating same
- Patent number 7,770,231
- Issue date Aug 3, 2010
- Veeco Instruments, Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for obtaining quantitative measurements using...
- Patent number 7,596,990
- Issue date Oct 6, 2009
- Veeco Instruments, Inc.
- Chanmin Su
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Scanning probe microscope with compact scanner
- Publication number 20120278957
- Publication date Nov 1, 2012
- Bruker Nano, Inc.
- Nghi Phan
- G01 - MEASURING TESTING
Information Patent Application
FAST-SCANNING SPM SCANNER AND METHOD OF OPERATING SAME
- Publication number 20120204295
- Publication date Aug 9, 2012
- Bruker Nano, Inc.
- Nghi Phan
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Obtaining Quantitative Measurements Using...
- Publication number 20090222958
- Publication date Sep 3, 2009
- Veeco Instruments Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Fast-Scanning SPM and Method of Operating Same
- Publication number 20090032706
- Publication date Feb 5, 2009
- Veeco Instruments Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
Fast-Scanning SPM Scanner and Method of Operating Same
- Publication number 20080223119
- Publication date Sep 18, 2008
- Veeco Instruments Inc.
- Nghi Phan
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for obtaining quantitative measurements using...
- Publication number 20060000263
- Publication date Jan 5, 2006
- Veeco Instruments Inc.
- Chanmin Su
- G01 - MEASURING TESTING