Nhon T. Do

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Mountain View, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Chip scale electrical test fixture with isolation plate having a re...
- Patent number 6,531,774
- Issue date Mar 11, 2003
- Advanced Micro Devices, Inc.
- Nhon T. Do
- G01 - MEASURING TESTING
Information Patent Grant
Heat sink grounded to a grounded package lid
- Patent number 6,512,675
- Issue date Jan 28, 2003
- Advanced Micro Devices, Inc.
- Thomas S. Tarter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining coplanarity of electrical contact of BGA typ...
- Patent number 6,476,625
- Issue date Nov 5, 2002
- Advanced Micro Devices, Inc.
- Nhon T. Do
- G01 - MEASURING TESTING
Information Patent Grant
Chip scale electrical test fixture
- Patent number 6,424,140
- Issue date Jul 23, 2002
- Advanced Micro Devices, Inc.
- Nhon T. Do
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for electrical characterization of an integrat...
- Patent number 6,396,296
- Issue date May 28, 2002
- Advanced Micro Devices, Inc.
- Thomas S. Tarter
- G01 - MEASURING TESTING
Information Patent Grant
Chip scale electrical test fixture with isolation plate having an a...
- Patent number 6,384,618
- Issue date May 7, 2002
- Advanced Micro Devices, Inc.
- John W. Pursel
- G01 - MEASURING TESTING