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Patents Grantslast 30 patents

Information Patent Grant
Probe card with angled probe and wafer testing method using the same
- Patent number 11,994,555
- Issue date May 28, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yuan-Chun Wu
- G01 - MEASURING TESTING
Information Patent Grant
Probe card with angled probe and wafer testing method using the same
- Patent number 11,105,848
- Issue date Aug 31, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yuan-Chun Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card and wafer testing system and wafer testing method
- Patent number 10,670,654
- Issue date Jun 2, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yuan-Chun Wu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER ACCEPTANCE TEST TOOL AND TEST METHOD USING THEREOF
- Publication number 20250155491
- Publication date May 15, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jin YAO
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD WITH ANGLED PROBE AND WAFER TESTING METHOD USING THE SAME
- Publication number 20210389370
- Publication date Dec 16, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yuan-Chun WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE CARD AND WAFER TESTING METHOD
- Publication number 20200292615
- Publication date Sep 17, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yuan-Chun WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE CARD AND WAFER TESTING SYSTEM AND WAFER TESTING METHOD
- Publication number 20170184663
- Publication date Jun 29, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yuan-Chun WU
- G01 - MEASURING TESTING