Nic Bloomfield

Person

Toronto, CA

People

Patents Grantslast 30 patents

Information Patent Grant
Method for real time encoding of scanning SWATH data and probabilis...
- Patent number 12,080,533
- Issue date Sep 3, 2024
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Agnostic compound elution determination
- Patent number 11,953,478
- Issue date Apr 9, 2024
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic equilibration time calculation to improve MS/MS dynamic range
- Patent number 11,923,183
- Issue date Mar 5, 2024
- Douglas Arnold Simmons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Acquisition strategy for top-down analysis with reduced background...
- Patent number 11,848,181
- Issue date Dec 19, 2023
- DH Technologies Development Pte. Ltd.
- Pavel Ryumin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TOF qualitative measures using a multichannel detector
- Patent number 11,791,150
- Issue date Oct 17, 2023
- DH Technologies Development Pte. Ltd.
- David Michael Cox
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two-and-a-half channel detection system for time-of-flight (TOF) ma...
- Patent number 10,784,098
- Issue date Sep 22, 2020
- DH Technologies Development Pte. Ltd.
- Igor Chernushevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for identifying precursor and product ion pairs...
- Patent number 10,651,019
- Issue date May 12, 2020
- DH Technologies Development Pte. Ltd.
- Gordana Ivosev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Rapid scanning of wide quadrupole RF windows while toggling fragmen...
- Patent number 10,079,137
- Issue date Sep 18, 2018
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for identifying precursor ions from product ion...
- Patent number 10,068,753
- Issue date Sep 4, 2018
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for selecting ions for ion fragmentation
- Patent number 10,008,376
- Issue date Jun 26, 2018
- DH Technologies Development Pte. Ltd.
- Nic Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Grouping amplitudes of TOF extractions to detect convolution due to...
- Patent number 9,978,575
- Issue date May 22, 2018
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for arbitrary quadrupole transmission windowing
- Patent number 9,768,009
- Issue date Sep 19, 2017
- DH Technologies Development Pte. Ltd.
- James Walter Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Removal of ions from survey scans using variable window band-pass f...
- Patent number 9,685,312
- Issue date Jun 20, 2017
- DH Technologies Development Pte. Ltd.
- Stephen A. Tate
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Intensity correction for TOF data acquisition
- Patent number 9,514,921
- Issue date Dec 6, 2016
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for identifying precursor ions from product ion...
- Patent number 9,472,387
- Issue date Oct 18, 2016
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for analyzing substances using a mass spectrometer
- Patent number 8,618,474
- Issue date Dec 31, 2013
- DH Technologies Development Pte. Ltd.
- Chris M. Lock
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for maintaining the precision of mass measurement
- Patent number 8,306,758
- Issue date Nov 6, 2012
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for analyzing substances using a mass spectrometer
- Patent number 8,026,479
- Issue date Sep 27, 2011
- DH Technologies Development Pte. Ltd.
- Chris M. Lock
- G01 - MEASURING TESTING
Information Patent Grant
Mass defect triggered information dependent acquisition
- Patent number 7,589,318
- Issue date Sep 15, 2009
- MDS Inc.
- Nic Bloomfield
- G01 - MEASURING TESTING
Information Patent Grant
Fragmenting ions in mass spectrometry
- Patent number 7,541,575
- Issue date Jun 2, 2009
- MDS Inc.
- Christopher Mark Lock
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, system and computer software product for specific identific...
- Patent number 7,417,223
- Issue date Aug 26, 2008
- MDS Inc.
- Yves LeBlanc
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Broad ion fragmentation coverage in mass spectrometry by varying th...
- Patent number 7,351,957
- Issue date Apr 1, 2008
- MDS Inc.
- Nic Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Broad ion fragmentation coverage in mass spectrometry by varying th...
- Patent number 7,199,361
- Issue date Apr 3, 2007
- MDS Inc.
- Nic Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method for Noise Reduction and Ion Rate Estimation Using an Analog...
- Publication number 20250014880
- Publication date Jan 9, 2025
- DH Technologies Development Pte. Ltd.
- Gordana IVOSEV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTENSITY-INDEPENDENT PRECURSOR INFERENCE IN MASS SPECTROSCOPY
- Publication number 20240347331
- Publication date Oct 17, 2024
- DH Technologies Development Pte. Ltd.
- Gordana IVOSEV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR REAL TIME ENCODING OF SCANNING SWATH DATA AND PROBABILIS...
- Publication number 20240331991
- Publication date Oct 3, 2024
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA STORAGE FOR TOF INSTRUMENTATION
- Publication number 20240282560
- Publication date Aug 22, 2024
- DH Technologies Development Pte. Ltd.
- Lyle L. BURTON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Precise Tuning of MCP-Based Ion Detector Using Isotope Ratios with...
- Publication number 20240242948
- Publication date Jul 18, 2024
- DH Technologies Development Pte. Ltd.
- Douglas Arnold Simmons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Linear Quantitative Dynamic Range Extension
- Publication number 20240177982
- Publication date May 30, 2024
- DH Technologies Development Pte. Ltd.
- Gordana Ivosev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamic Equilibration Time Calculation to Improve MS/MS Dynamic Range
- Publication number 20230335386
- Publication date Oct 19, 2023
- DH Technologies Development Pte. Ltd.
- Douglas Arnold Simmons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR CHARGE STATE ASSIGNMENT IN MASS SPECTROMETRY
- Publication number 20230298876
- Publication date Sep 21, 2023
- DH Technologies Development Pte. Ltd.
- Nic BLOOMFIELD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR CHARGE STATE ASSIGNMENT IN MASS SPECTROMETRY
- Publication number 20230282469
- Publication date Sep 7, 2023
- DH Technologies Development Pte. Ltd.
- Nic BLOOMFIELD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Improved TOF Qualitative Measures using a Multichannel Detector
- Publication number 20220199390
- Publication date Jun 23, 2022
- DH Technologies Development Pte. Ltd.
- David Michael Cox
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Agnostic Compound Elution Determination
- Publication number 20220187260
- Publication date Jun 16, 2022
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Real Time Encoding of Scanning SWATH Data and Probabilis...
- Publication number 20220189754
- Publication date Jun 16, 2022
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Acquisition Strategy for Top-Down Analysis with Reduced Background...
- Publication number 20220093377
- Publication date Mar 24, 2022
- DH Technologies Development Pte. Ltd.
- Pavel Ryumin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamically Concentrating Ion Packets in the Extraction Region of a...
- Publication number 20210366701
- Publication date Nov 25, 2021
- DH Technologies Development Pte. Ltd.
- Nic BLOOMFIELD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamic Equilibration Time Calculation to Improve MS/MS Dynamic Range
- Publication number 20200234936
- Publication date Jul 23, 2020
- DH Technologies Development Pte. Ltd.
- Douglas Arnold Simmons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Two-and-a-Half Channel Detection System for Time-of-Flight (TOF) Ma...
- Publication number 20200020517
- Publication date Jan 16, 2020
- DH Technologies Development Pte. Ltd.
- Igor Chernushevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Identifying Precursor and Product Ion Pairs...
- Publication number 20190228957
- Publication date Jul 25, 2019
- DH Technologies Development Pte. Ltd.
- Gordana Ivosev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Rapid Scanning of Wide Quadrupole RF Windows While Toggling Fragmen...
- Publication number 20180012742
- Publication date Jan 11, 2018
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Systems for Selecting Ions for Ion Fragmentation
- Publication number 20170338091
- Publication date Nov 23, 2017
- DH Technologies Development Pte. Ltd.
- Nic Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Grouping Amplitudes of TOF Extractions to Detect Convolution Due to...
- Publication number 20170250065
- Publication date Aug 31, 2017
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Identifying Precursor ions from Product Ion...
- Publication number 20160268111
- Publication date Sep 15, 2016
- DH TECHNOLOGIES DEVELOPMENT PTE., LTD.
- Nic G. Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Arbitrary Quadrupole Transmission Windowing
- Publication number 20160233077
- Publication date Aug 11, 2016
- James Walter Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Identifying Precursor ions from Product Ion...
- Publication number 20160217988
- Publication date Jul 28, 2016
- Nic G. Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Recording Average Ion Response
- Publication number 20160209361
- Publication date Jul 21, 2016
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- G01 - MEASURING TESTING
Information Patent Application
Intensity Correction for TOF Data Acquisition
- Publication number 20160189943
- Publication date Jun 30, 2016
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Intensity Correction for TOF Data Acquisition
- Publication number 20160148791
- Publication date May 26, 2016
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Removal of Ions from Survey Scans Using Variable Window Band-Pass F...
- Publication number 20160042933
- Publication date Feb 11, 2016
- DH Technologies Development Pte. Ltd.
- Stephen A. Tate
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Removal of Ions from Survey Scans Using Variable Window Band-Pass F...
- Publication number 20140117224
- Publication date May 1, 2014
- DH Technologies Development Pte. Ltd.
- Stephen A. Tate
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR ANALYZING SUBSTANCES USING A MASS SPECTROMETER
- Publication number 20110315870
- Publication date Dec 29, 2011
- Applera Corporation
- Chris M. LOCK
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MAINTAINING THE PRECISION OF MASS MEASUREMENT
- Publication number 20110082658
- Publication date Apr 7, 2011
- Life Technologies and MDS Analytical Technologies
- Nic G. Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS

Nic Bloomfield

Person

Patents Grantslast 30 patents

Method for real time encoding of scanning SWATH data and probabilis...

Agnostic compound elution determination

Dynamic equilibration time calculation to improve MS/MS dynamic range

Acquisition strategy for top-down analysis with reduced background...

TOF qualitative measures using a multichannel detector

Two-and-a-half channel detection system for time-of-flight (TOF) ma...

Systems and methods for identifying precursor and product ion pairs...

Rapid scanning of wide quadrupole RF windows while toggling fragmen...

Systems and methods for identifying precursor ions from product ion...

Methods and systems for selecting ions for ion fragmentation

Grouping amplitudes of TOF extractions to detect convolution due to...

Systems and methods for arbitrary quadrupole transmission windowing

Removal of ions from survey scans using variable window band-pass f...

Intensity correction for TOF data acquisition

Systems and methods for identifying precursor ions from product ion...

Systems and methods for analyzing substances using a mass spectrometer

Systems and methods for maintaining the precision of mass measurement

Systems and methods for analyzing substances using a mass spectrometer

Mass defect triggered information dependent acquisition

Fragmenting ions in mass spectrometry

Method, system and computer software product for specific identific...

Broad ion fragmentation coverage in mass spectrometry by varying th...

Broad ion fragmentation coverage in mass spectrometry by varying th...

Patents Applicationslast 30 patents

Method for Noise Reduction and Ion Rate Estimation Using an Analog...

INTENSITY-INDEPENDENT PRECURSOR INFERENCE IN MASS SPECTROSCOPY

METHOD FOR REAL TIME ENCODING OF SCANNING SWATH DATA AND PROBABILIS...

DATA STORAGE FOR TOF INSTRUMENTATION

Precise Tuning of MCP-Based Ion Detector Using Isotope Ratios with...

Method for Linear Quantitative Dynamic Range Extension

Dynamic Equilibration Time Calculation to Improve MS/MS Dynamic Range

SYSTEMS AND METHODS FOR CHARGE STATE ASSIGNMENT IN MASS SPECTROMETRY

SYSTEMS AND METHODS FOR CHARGE STATE ASSIGNMENT IN MASS SPECTROMETRY

Improved TOF Qualitative Measures using a Multichannel Detector

Agnostic Compound Elution Determination

Method for Real Time Encoding of Scanning SWATH Data and Probabilis...

Acquisition Strategy for Top-Down Analysis with Reduced Background...

Dynamically Concentrating Ion Packets in the Extraction Region of a...

Dynamic Equilibration Time Calculation to Improve MS/MS Dynamic Range

Two-and-a-Half Channel Detection System for Time-of-Flight (TOF) Ma...

Systems and Methods for Identifying Precursor and Product Ion Pairs...

Rapid Scanning of Wide Quadrupole RF Windows While Toggling Fragmen...

Methods and Systems for Selecting Ions for Ion Fragmentation

Grouping Amplitudes of TOF Extractions to Detect Convolution Due to...

Systems and Methods for Identifying Precursor ions from Product Ion...

Systems and Methods for Arbitrary Quadrupole Transmission Windowing

Systems and Methods for Identifying Precursor ions from Product Ion...

Systems and Methods for Recording Average Ion Response

Intensity Correction for TOF Data Acquisition

Intensity Correction for TOF Data Acquisition

Removal of Ions from Survey Scans Using Variable Window Band-Pass F...

Removal of Ions from Survey Scans Using Variable Window Band-Pass F...

SYSTEMS AND METHODS FOR ANALYZING SUBSTANCES USING A MASS SPECTROMETER

SYSTEMS AND METHODS FOR MAINTAINING THE PRECISION OF MASS MEASUREMENT