Nicholas Alan Charipar

Person

Batavia, IN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for transfer of ions for analysis
- Patent number 10,290,483
- Issue date May 14, 2019
- Purdue Research Foundation
- Zheng Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for transfer of ions for analysis
- Patent number 10,008,374
- Issue date Jun 26, 2018
- Purdue Research Foundation
- Zheng Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for transfer of ions for analysis
- Patent number 9,484,195
- Issue date Nov 1, 2016
- Purdue Research Foundation
- Zheng Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for transfer of ions for analysis
- Patent number 9,159,540
- Issue date Oct 13, 2015
- Purdue Research Foundation
- Zheng Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low temperature plasma probe and methods of use thereof
- Patent number 9,064,674
- Issue date Jun 23, 2015
- Purdue Research Foundation
- Zheng Ouyang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Systems and methods for transfer of ions for analysis
- Patent number 8,963,079
- Issue date Feb 24, 2015
- Purdue Research Foundation
- Zheng Ouyang
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for transfer of ions for analysis
- Patent number 8,803,085
- Issue date Aug 12, 2014
- Purdue Research Foundation
- Zheng Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low temperature plasma probe and methods of use thereof
- Patent number 8,772,710
- Issue date Jul 8, 2014
- Purdue Research Foundation
- Zheng Ouyang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Systems and methods for transfer of ions for analysis
- Patent number 8,686,351
- Issue date Apr 1, 2014
- Purdue Research Foundation
- Zheng Ouyang
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for transfer of ions for analysis
- Patent number 8,592,756
- Issue date Nov 26, 2013
- Purdue Research Foundation
- Zheng Ouyang
- G01 - MEASURING TESTING
Information Patent Grant
Low temperature plasma probe and methods of use thereof
- Patent number 8,519,354
- Issue date Aug 27, 2013
- Purdue Research Foundation
- Nicholas Charipar
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Systems and methods for transfer of ions for analysis
- Patent number 8,410,431
- Issue date Apr 2, 2013
- Purdue Research Foundation
- Zheng Ouyang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR TRANSFER OF IONS FOR ANALYSIS
- Publication number 20180286651
- Publication date Oct 4, 2018
- Purdue Research Foundation
- Zheng Ouyang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TRANSFER OF IONS FOR ANALYSIS
- Publication number 20170154761
- Publication date Jun 1, 2017
- Purdue Research Foundation
- Zheng Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR TRANSFER OF IONS FOR ANALYSIS
- Publication number 20160118237
- Publication date Apr 28, 2016
- Purdue Research Foundation
- Zheng Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR TRANSFER OF IONS FOR ANALYSIS
- Publication number 20150262803
- Publication date Sep 17, 2015
- Purdue Research Foundation
- Zheng Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR TRANSFER OF IONS FOR ANALYSIS
- Publication number 20150014525
- Publication date Jan 15, 2015
- Purdue Research Foundation
- Zheng Ouyang
- G01 - MEASURING TESTING
Information Patent Application
LOW TEMPERATURE PLASMA PROBE AND METHODS OF USE THEREOF
- Publication number 20140299764
- Publication date Oct 9, 2014
- Purdue Research Foundation
- Zheng Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR TRANSFER OF IONS FOR ANALYSIS
- Publication number 20140158882
- Publication date Jun 12, 2014
- Purdue Research Foundation
- Zheng Ouyang
- G01 - MEASURING TESTING
Information Patent Application
LOW TEMPERATURE PLASMA PROBE AND METHODS OF USE THEREOF
- Publication number 20140011282
- Publication date Jan 9, 2014
- Purdue Research Foundation
- Zheng Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR TRANSFER OF IONS FOR ANALYSIS
- Publication number 20130292564
- Publication date Nov 7, 2013
- Zheng Ouyang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TRANSFER OF IONS FOR ANALYSIS
- Publication number 20130126723
- Publication date May 23, 2013
- Zheng Ouyang
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TRANSFER OF IONS FOR ANALYSIS
- Publication number 20110240844
- Publication date Oct 6, 2011
- Purdue Research Foundation
- Zheng Ouyang
- G01 - MEASURING TESTING
Information Patent Application
LOW TEMPERATURE PLASMA PROBE AND METHODS OF USE THEREOF
- Publication number 20110042560
- Publication date Feb 24, 2011
- Purdue Research Foundation
- Zheng Ouyang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Nicholas Alan Charipar

Person

Patents Grantslast 30 patents

Systems and methods for transfer of ions for analysis

Systems and methods for transfer of ions for analysis

Systems and methods for transfer of ions for analysis

Systems and methods for transfer of ions for analysis

Low temperature plasma probe and methods of use thereof

Systems and methods for transfer of ions for analysis

Systems and methods for transfer of ions for analysis

Low temperature plasma probe and methods of use thereof

Systems and methods for transfer of ions for analysis

Systems and methods for transfer of ions for analysis

Low temperature plasma probe and methods of use thereof

Systems and methods for transfer of ions for analysis

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR TRANSFER OF IONS FOR ANALYSIS

SYSTEMS AND METHODS FOR TRANSFER OF IONS FOR ANALYSIS

SYSTEMS AND METHODS FOR TRANSFER OF IONS FOR ANALYSIS

SYSTEMS AND METHODS FOR TRANSFER OF IONS FOR ANALYSIS

SYSTEMS AND METHODS FOR TRANSFER OF IONS FOR ANALYSIS

LOW TEMPERATURE PLASMA PROBE AND METHODS OF USE THEREOF

SYSTEMS AND METHODS FOR TRANSFER OF IONS FOR ANALYSIS

LOW TEMPERATURE PLASMA PROBE AND METHODS OF USE THEREOF

SYSTEMS AND METHODS FOR TRANSFER OF IONS FOR ANALYSIS

SYSTEMS AND METHODS FOR TRANSFER OF IONS FOR ANALYSIS

SYSTEMS AND METHODS FOR TRANSFER OF IONS FOR ANALYSIS

LOW TEMPERATURE PLASMA PROBE AND METHODS OF USE THEREOF