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Nicholas Allen
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Bedford, MA, US
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last 30 patents
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Patent Grant
Multistation surface inspection system
Patent number
5,814,829
Issue date
Sep 29, 1998
QC Optics, Inc.
Sergey V. Broude
G01 - MEASURING TESTING
Information
Patent Grant
Pellicle reflectivity monitoring system having means for compensati...
Patent number
5,717,198
Issue date
Feb 10, 1998
QC Optics, Inc.
Sergey V. Broude
G01 - MEASURING TESTING
Information
Patent Grant
Plate holder for a surface inspection system
Patent number
5,675,409
Issue date
Oct 7, 1997
QC Optics, Inc.
Sergey V. Broude
G01 - MEASURING TESTING
Information
Patent Grant
Surface displacement detection and adjustment system
Patent number
5,672,885
Issue date
Sep 30, 1997
QC Optics, Inc.
Nicholas Allen
G01 - MEASURING TESTING
Information
Patent Grant
Optical inspection system and method for detecting flaws on a diffr...
Patent number
5,625,193
Issue date
Apr 29, 1997
QC Optics, Inc.
Sergey V. Broude
G01 - MEASURING TESTING
Information
Patent Grant
Displacement detection system
Patent number
5,610,719
Issue date
Mar 11, 1997
QC Optics, Inc.
Nicholas Allen
G01 - MEASURING TESTING
Information
Patent Grant
Data processing system and method for a surface inspection apparatus
Patent number
5,602,401
Issue date
Feb 11, 1997
QC Optics, Inc.
Sergey V. Broude
G01 - MEASURING TESTING
Information
Patent Grant
Surface pit and mound detection and discrimination system and method
Patent number
5,389,794
Issue date
Feb 14, 1995
QC Optics, Inc.
Nicholas C. Allen
G01 - MEASURING TESTING