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Nicholas B. Tufillaro
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Loveland, CO, US
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Patents Grants
last 30 patents
Information
Patent Grant
Excitation signal generator for improved accuracy of model-based te...
Patent number
8,005,633
Issue date
Aug 23, 2011
Verigy (Singapore) Pte. Ltd.
Lee Alton Barford
G01 - MEASURING TESTING
Information
Patent Grant
Model based testing for electronic devices
Patent number
7,457,729
Issue date
Nov 25, 2008
Verigy (Singapore) Pte. Ltd.
Ajay Khoche
G01 - MEASURING TESTING
Information
Patent Grant
Highly constrained tomography for automated inspection of area arrays
Patent number
7,099,435
Issue date
Aug 29, 2006
Agilent Technologies, Inc.
John M. Heumann
G01 - MEASURING TESTING
Information
Patent Grant
Method for the rapid estimation of figures of merit for multiple de...
Patent number
6,892,155
Issue date
May 10, 2005
Agilent Technologies, Inc.
Kevin Gee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for extraction of nonlinear black-box behavior...
Patent number
6,850,871
Issue date
Feb 1, 2005
Agilent Technologies, Inc.
Lee A. Barford
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Excitation signal and radial basis function methods for use in extr...
Patent number
6,775,646
Issue date
Aug 10, 2004
Agilent Technologies, Inc.
Nicholas B. Tufillaro
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
MODEL-BASED TESTING METHOD AND SYSTEM USING EMBEDDED MODELS
Publication number
20080086668
Publication date
Apr 10, 2008
Stanley T. Jefferson
G01 - MEASURING TESTING
Information
Patent Application
Excitation signal generator for improved accuracy of model-based te...
Publication number
20070185671
Publication date
Aug 9, 2007
Leo Alton Barford
G01 - MEASURING TESTING
Information
Patent Application
Model based testing for electronic devices
Publication number
20060155411
Publication date
Jul 13, 2006
Ajay Khoche
G01 - MEASURING TESTING
Information
Patent Application
Highly constrained tomography for automated inspection of area arrays
Publication number
20050105682
Publication date
May 19, 2005
John M. Heumann
G01 - MEASURING TESTING
Information
Patent Application
Method for the rapid estimation of figures of merit for multiple de...
Publication number
20040098215
Publication date
May 20, 2004
Kevin Gee
G06 - COMPUTING CALCULATING COUNTING