Nicholas Darby

Person

Columbus, OH, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for inspection of IC devices
- Patent number 12,254,613
- Issue date Mar 18, 2025
- Battelle Memorial Institute
- Nicholas Darby
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Causal relational artificial intelligence and risk framework for ma...
- Patent number 12,253,837
- Issue date Mar 18, 2025
- Battelle Memorial Institute
- Jeremy Bellay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical end-pointing for integrated circuit delayering; systems and...
- Patent number 12,236,573
- Issue date Feb 25, 2025
- Battelle Memorial Institute
- Jonathan Scholl
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data handling and machine learning
- Patent number 12,217,170
- Issue date Feb 4, 2025
- Battelle Memorial Institute
- Anthony George
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for inspection of IC devices
- Patent number 11,941,797
- Issue date Mar 26, 2024
- Battelle Memorial Institute
- Nicholas Darby
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Systems and Methods for Inspection of IC Devices
- Publication number 20250191172
- Publication date Jun 12, 2025
- Battelle Memorial Institute
- Nicholas Darby
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CAUSAL RELATIONAL ARTIFICIAL INTELLIGENCE AND RISK FRAMEWORK FOR MA...
- Publication number 20250181040
- Publication date Jun 5, 2025
- Battelle Memorial Institute
- Jeremy Bellay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL END-POINT DETECTION FOR INTEGRATED CIRCUIT DELAYERING; SYST...
- Publication number 20250166164
- Publication date May 22, 2025
- Battelle Memorial Institute
- Jonathan Scholl
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA HANDLING AND MACHINE LEARNING
- Publication number 20250124285
- Publication date Apr 17, 2025
- Battelle Memorial Institute
- Anthony George
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods for Inspection of IC Devices
- Publication number 20240185408
- Publication date Jun 6, 2024
- Battelle Memorial Institute
- Nicholas Darby
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONNECTING ADVERSARIAL ATTACKS TO NEURAL NETWORK TOPOGRAPHY
- Publication number 20230145002
- Publication date May 11, 2023
- Battelle Memorial Institute
- Nicholas W. DARBY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CAUSAL RELATIONAL ARTIFICIAL INTELLIGENCE AND RISK FRAMEWORK FOR MA...
- Publication number 20220342371
- Publication date Oct 27, 2022
- Battelle Memorial Institute
- Jeremy Bellay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods for Inspection of IC Devices
- Publication number 20220284568
- Publication date Sep 8, 2022
- Battelle Memorial Institute
- Nicholas Darby
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL END-POINTING FOR INTEGRATED CIRCUIT DELAYERING; SYSTEMS AND...
- Publication number 20220180505
- Publication date Jun 9, 2022
- Battelle Memorial Institute
- Jonathan Scholl
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA HANDLING AND MACHINE LEARNING
- Publication number 20210304002
- Publication date Sep 30, 2021
- Battelle Memorial Institute
- Anthony George
- G06 - COMPUTING CALCULATING COUNTING

Nicholas Darby

Person

Patents Grantslast 30 patents

Systems and methods for inspection of IC devices

Causal relational artificial intelligence and risk framework for ma...

Optical end-pointing for integrated circuit delayering; systems and...

Data handling and machine learning

Systems and methods for inspection of IC devices

Patents Applicationslast 30 patents

Systems and Methods for Inspection of IC Devices

CAUSAL RELATIONAL ARTIFICIAL INTELLIGENCE AND RISK FRAMEWORK FOR MA...

OPTICAL END-POINT DETECTION FOR INTEGRATED CIRCUIT DELAYERING; SYST...

DATA HANDLING AND MACHINE LEARNING

Systems and Methods for Inspection of IC Devices

CONNECTING ADVERSARIAL ATTACKS TO NEURAL NETWORK TOPOGRAPHY

CAUSAL RELATIONAL ARTIFICIAL INTELLIGENCE AND RISK FRAMEWORK FOR MA...

Systems and Methods for Inspection of IC Devices

OPTICAL END-POINTING FOR INTEGRATED CIRCUIT DELAYERING; SYSTEMS AND...

DATA HANDLING AND MACHINE LEARNING