Nicholas E. Webb

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
RF impedance model based fault detection
- Patent number 10,748,748
- Issue date Aug 18, 2020
- Lam Research Corporation
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
RF impedance model based fault detection
- Patent number 10,128,090
- Issue date Nov 13, 2018
- Lam Research Corporation
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etch tool process indicator method and apparatus
- Patent number 8,492,174
- Issue date Jul 23, 2013
- Lam Research Corporation
- Keren Jacobs Kanarik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etch tool process indicator method and apparatus
- Patent number 8,206,996
- Issue date Jun 26, 2012
- Lam Research Corporation
- Keren Jacobs Kanarik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon parts having reduced metallic impurity concentration for pl...
- Patent number 7,517,803
- Issue date Apr 14, 2009
- Lam Research Corporation
- Daxing Ren
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Silicon parts having reduced metallic impurity concentration for pl...
- Patent number 6,846,726
- Issue date Jan 25, 2005
- Lam Research Corporation
- Daxing Ren
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
RF IMPEDANCE MODEL BASED FAULT DETECTION
- Publication number 20190057847
- Publication date Feb 21, 2019
- LAM RESEARCH CORPORATION
- John C. Valcore
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
RF Impedance Model Based Fault Detection
- Publication number 20150069912
- Publication date Mar 12, 2015
- LAM RESEARCH CORPORATION
- John C. Valcore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ETCH TOOL PROCESS INDICATOR METHOD AND APPARATUS
- Publication number 20120231556
- Publication date Sep 13, 2012
- LAM RESEARCH CORPORATION
- Keren Jacobs Kanarik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ETCH TOOL PROCESS INDICATOR METHOD AND APPARATUS
- Publication number 20100093115
- Publication date Apr 15, 2010
- LAM RESEARCH CORPORATION
- Keren Jacobs Kanarik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Silicon parts having reduced metallic impurity concentration for pl...
- Publication number 20050045593
- Publication date Mar 3, 2005
- Lam Research Corporation
- Daxing Ren
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Silicon parts having reduced metallic impurity concentration for pl...
- Publication number 20040161943
- Publication date Aug 19, 2004
- Daxing Ren
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...