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Nicholas J. Cedrone
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Wellesley Hills, MA, US
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last 30 patents
Information
Patent Grant
Broad band contactor assembly for testing integrated circuit devices
Patent number
4,956,604
Issue date
Sep 11, 1990
Daymarc Corporation
Nicholas J. Cedrone
G01 - MEASURING TESTING
Information
Patent Grant
Contactor assembly for testing integrated circuits
Patent number
4,866,374
Issue date
Sep 12, 1989
Daymarc Corporation
Nicholas J. Cedrone
G01 - MEASURING TESTING
Information
Patent Grant
Vacuum pick and place mechanism for integrated circuit test handler
Patent number
4,801,234
Issue date
Jan 31, 1989
Daymarc Corporation
Nicholas J. Cedrone
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Air-assist accumulating and transfer unit for an electronic device...
Patent number
4,781,494
Issue date
Nov 1, 1988
Daymarc Corporation
Nicholas J. Cedrone
G01 - MEASURING TESTING
Information
Patent Grant
Metering and singulating apparatus for integrated circuits
Patent number
4,759,435
Issue date
Jul 26, 1988
Daymarc Corporation
Nicholas J. Cedrone
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
Contactor for integrated circuits
Patent number
4,747,784
Issue date
May 31, 1988
Daymarc Corporation
Nicholas J. Cedrone
G01 - MEASURING TESTING
Information
Patent Grant
Broad band contactor assembly for testing integrated circuit devices
Patent number
4,689,556
Issue date
Aug 25, 1987
Daymarc Corporation
Nicholas J. Cedrone
G01 - MEASURING TESTING
Information
Patent Grant
Momentum arresting device for an integrated circuit tester
Patent number
4,641,738
Issue date
Feb 10, 1987
Daymarc Corporation
Nicholas J. Cedrone
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automatic feed apparatus and process for integrated circuits stored...
Patent number
4,618,305
Issue date
Oct 21, 1986
Daymarc Corporation
Nicholas J. Cedrone
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Storage unit for an integrated circuit tester
Patent number
4,546,404
Issue date
Oct 8, 1985
Daymarc Corporation
Nicholas J. Cedrone
G01 - MEASURING TESTING
Information
Patent Grant
Symmetrical, single point drive for contacts of an integrated circu...
Patent number
4,534,605
Issue date
Aug 13, 1985
Daymarc Corporation
Nicholas J. Cedrone
G01 - MEASURING TESTING
Information
Patent Grant
Axial lead tester/sorter
Patent number
4,500,003
Issue date
Feb 19, 1985
Nicholas J. Cedrone
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Grant
Interface assembly for testing integrated circuit devices
Patent number
4,473,798
Issue date
Sep 25, 1984
Daymarc Corporation
Nicholas J. Cedrone
G01 - MEASURING TESTING
Information
Patent Grant
Handling and test apparatus for radial lead electronic devices
Patent number
4,429,275
Issue date
Jan 31, 1984
Nicholas J. Cedrone
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Grant
Broad band contactor assembly for testing integrated circuit devices
Patent number
4,419,626
Issue date
Dec 6, 1983
Daymarc Corporation
Nicholas J. Cedrone
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic storage system and method for an axial lead sorter
Patent number
4,209,959
Issue date
Jul 1, 1980
Daymarc Corporation
Walter S. Bachman
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
Test contactor system for semiconductor device handling apparatus
Patent number
4,047,780
Issue date
Sep 13, 1977
Nicholas J. Cedrone
G01 - MEASURING TESTING