Nicholas James Keller

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La Jolla, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Effective cell approximation model for logic structures
- Patent number 12,013,350
- Issue date Jun 18, 2024
- Onto Innovation Inc.
- Kevin Eduard Heidrich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Target for optical measurement of trenches
- Patent number 11,808,715
- Issue date Nov 7, 2023
- Onto Innovation Inc.
- Nicholas James Keller
- G01 - MEASURING TESTING
Information Patent Grant
Opto-acoustic measurement of a transparent film stack
- Patent number 11,668,644
- Issue date Jun 6, 2023
- Onto Innovation Inc.
- George Andrew Antonelli
- G01 - MEASURING TESTING
Information Patent Grant
Calibration of azimuth angle for optical metrology stage using grat...
- Patent number 11,079,220
- Issue date Aug 3, 2021
- Onto Innovation Inc.
- Nicholas James Keller
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MASK AND PROCEDURE FOR PROCESS PERFORMANCE DETECTION
- Publication number 20240248045
- Publication date Jul 25, 2024
- ONTO INNOVATION INC.
- Kevin Eduard HEIDRICH
- G01 - MEASURING TESTING
Information Patent Application
EFFECTIVE CELL APPROXIMATION MODEL FOR LOGIC STRUCTURES
- Publication number 20220357286
- Publication date Nov 10, 2022
- ONTO INNOVATION INC.
- Kevin Eduard HEIDRICH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-LAYER CALIBRATION FOR EMPIRICAL OVERLAY MEASUREMENT
- Publication number 20220326626
- Publication date Oct 13, 2022
- ONTO INNOVATION INC.
- Nigel P. SMITH
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTO-ACOUSTIC MEASUREMENT OF A TRANSPARENT FILM STACK
- Publication number 20220317025
- Publication date Oct 6, 2022
- ONTO INNOVATION INC.
- George Andrew Antonelli
- G01 - MEASURING TESTING
Information Patent Application
TARGET FOR OPTICAL MEASUREMENT OF TRENCHES
- Publication number 20210325317
- Publication date Oct 21, 2021
- ONTO INNOVATION INC.
- Nicholas JAMES KELLER
- G01 - MEASURING TESTING