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Nicholas Martin van Heel
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Eagle, ID, US
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Patents Grants
last 30 patents
Information
Patent Grant
Testing fuse configurations in semiconductor devices
Patent number
10,302,696
Issue date
May 28, 2019
Rambus Inc.
Adrian E. Ong
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Testing fuse configurations in semiconductor devices
Patent number
9,568,544
Issue date
Feb 14, 2017
Rambus Inc.
Adrian E. Ong
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Testing fuse configurations in semiconductor devices
Patent number
8,717,052
Issue date
May 6, 2014
Rambus Inc.
Adrian E. Ong
G01 - MEASURING TESTING
Information
Patent Grant
Test and observe mode for embedded memory
Patent number
6,535,999
Issue date
Mar 18, 2003
Micron Technology, Inc.
Todd A. Merritt
G11 - INFORMATION STORAGE
Information
Patent Grant
Oxide tracking voltage reference
Patent number
6,522,154
Issue date
Feb 18, 2003
International Business Machines Corporation
John Atkinson Fifield
G01 - MEASURING TESTING
Information
Patent Grant
System for testing integrated circuit devices
Patent number
6,496,027
Issue date
Dec 17, 2002
Micron Technology, Inc.
Joseph C. Sher
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
TESTING FUSE CONFIGURATIONS IN SEMICONDUCTOR DEVICES
Publication number
20170176533
Publication date
Jun 22, 2017
RAMBUS INC.
Adrian E. Ong
G01 - MEASURING TESTING
Information
Patent Application
TESTING FUSE CONFIGURATIONS IN SEMICONDUCTOR DEVICES
Publication number
20140333341
Publication date
Nov 13, 2014
RAMBUS INC.
Adrian E. Ong
G01 - MEASURING TESTING
Information
Patent Application
TESTING FUSE CONFIGURATIONS IN SEMICONDUCTOR DEVICES
Publication number
20110291693
Publication date
Dec 1, 2011
RAMBUS INC.
Adrian E. Ong
G01 - MEASURING TESTING
Information
Patent Application
Testing fuse configurations in semiconductor devices
Publication number
20080278190
Publication date
Nov 13, 2008
Adrian E. Ong
G01 - MEASURING TESTING
Information
Patent Application
System for testing integrated circuit devices
Publication number
20040201399
Publication date
Oct 14, 2004
Micron Technology, Inc.
Joseph C. Sher
G01 - MEASURING TESTING
Information
Patent Application
System for testing integrated circuit devices
Publication number
20030090285
Publication date
May 15, 2003
Micron Technology, Inc.
Joseph C. Sher
G01 - MEASURING TESTING
Information
Patent Application
Oxide tracking voltage reference
Publication number
20020130672
Publication date
Sep 19, 2002
International Business Machines Corporation
John Atkinson Fifield
G01 - MEASURING TESTING
Information
Patent Application
Intrinsic dual gate oxide MOSFET using a damascene gate process
Publication number
20020119637
Publication date
Aug 29, 2002
International Business Machines Corporation
Claude Louis Bertin
H01 - BASIC ELECTRIC ELEMENTS