Nicholas Ward

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Yield prediction feedback for controlling an equipment engineering...
- Patent number 8,774,956
- Issue date Jul 8, 2014
- Applied Materials, Inc.
- James Moyne
- G05 - CONTROLLING REGULATING
Information Patent Grant
Yield prediction feedback for controlling an equipment engineering...
- Patent number 8,612,043
- Issue date Dec 17, 2013
- Applied Materials, Inc.
- James Moyne
- G05 - CONTROLLING REGULATING
Information Patent Grant
Yield prediction feedback for controlling an equipment engineering...
- Patent number 7,974,723
- Issue date Jul 5, 2011
- Applied Materials, Inc.
- James Moyne
- G05 - CONTROLLING REGULATING
Information Patent Grant
Dynamic control of wafer processing paths in semiconductor manufact...
- Patent number 6,950,716
- Issue date Sep 27, 2005
- Applied Materials, Inc.
- Nicholas A. Ward
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
YIELD PREDICTION FEEDBACK FOR CONTROLLING AN EQUIPMENT ENGINEERING...
- Publication number 20110166688
- Publication date Jul 7, 2011
- James Moyne
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
YIELD PREDICTION FEEDBACK FOR CONTROLLING AN EQUIPMENT ENGINEERING...
- Publication number 20110166684
- Publication date Jul 7, 2011
- James Moyne
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
YIELD PREDICTION FEEDBACK FOR CONTROLLING AN EQUIPMENT ENGINEERING...
- Publication number 20090228129
- Publication date Sep 10, 2009
- James Moyne
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Dynamic control of wafer processing paths in semiconductor manufact...
- Publication number 20030029383
- Publication date Feb 13, 2003
- Nicholas A. Ward
- G05 - CONTROLLING REGULATING