Nick HARTMANN

Person

Newcastle, WA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Digital holography metrology system
- Patent number 12,313,791
- Issue date May 27, 2025
- Mitutoyo Corporation
- Nick Hartmann
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne light source for use in metrology system
- Patent number 12,228,399
- Issue date Feb 18, 2025
- Mitutoyo Corporation
- Nick Hartmann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METROLOGY SYSTEM WITH POSITION AND ORIENTATION TRACKING UTILIZING P...
- Publication number 20250198806
- Publication date Jun 19, 2025
- MITUTOYO CORPORATION
- Norman LAMAN
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
METROLOGY SYSTEM WITH HIGH SPEED POSITION AND ORIENTATION TRACKING...
- Publication number 20250198744
- Publication date Jun 19, 2025
- MITUTOYO CORPORATION
- Nick HARTMANN
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY SYSTEM INCLUDING LASER AND RADAR CONFIGURATION
- Publication number 20250004133
- Publication date Jan 2, 2025
- MITUTOYO CORPORATION
- Ted Staton Cook
- G02 - OPTICS
Information Patent Application
RADAR METROLOGY SYSTEM INCLUDING CALIBRATION
- Publication number 20230314563
- Publication date Oct 5, 2023
- MITUTOYO CORPORATION
- Nick Hartmann
- G01 - MEASURING TESTING
Information Patent Application
RADAR METROLOGY SYSTEM
- Publication number 20230314595
- Publication date Oct 5, 2023
- MITUTOYO CORPORATION
- Nick Hartmann
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE LIGHT SOURCE FOR USE IN METROLOGY SYSTEM
- Publication number 20230062525
- Publication date Mar 2, 2023
- MITUTOYO CORPORATION
- Nick HARTMANN
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL HOLOGRAPHY METROLOGY SYSTEM
- Publication number 20230069087
- Publication date Mar 2, 2023
- MITUTOYO CORPORATION
- Nick HARTMANN
- G02 - OPTICS

Nick HARTMANN

Person

Patents Grantslast 30 patents

Digital holography metrology system

Heterodyne light source for use in metrology system

Patents Applicationslast 30 patents

METROLOGY SYSTEM WITH POSITION AND ORIENTATION TRACKING UTILIZING P...

METROLOGY SYSTEM WITH HIGH SPEED POSITION AND ORIENTATION TRACKING...

METROLOGY SYSTEM INCLUDING LASER AND RADAR CONFIGURATION

RADAR METROLOGY SYSTEM INCLUDING CALIBRATION

RADAR METROLOGY SYSTEM

HETERODYNE LIGHT SOURCE FOR USE IN METROLOGY SYSTEM

DIGITAL HOLOGRAPHY METROLOGY SYSTEM