Nick VERHEUL

Person

Den Bosch, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Metrology method and apparatus, computer program and lithographic s...
- Patent number 11,994,806
- Issue date May 28, 2024
- ASML Netherlands B.V.
- Alexandru Onose
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHODS RELATED TO AN AUTOENCODER MODEL OR SIMILAR FOR MANUFACTURIN...
- Publication number 20250217650
- Publication date Jul 3, 2025
- ASML NETHERLANDS B.V.
- Alexandru ONOSE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY METHOD AND APPARATUS, COMPUTER PROGRAM AND LITHOGRAPHIC S...
- Publication number 20240385531
- Publication date Nov 21, 2024
- ASML NETHERLANDS B.V.
- Alexandru ONOSE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MODULAR AUTOENCODER MODEL FOR MANUFACTURING PROCESS PARAMETER ESTIM...
- Publication number 20240354552
- Publication date Oct 24, 2024
- ASML NETHERLANDS B.V.
- Alexandru ONOSE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODULAR AUTOENCODER MODEL FOR MANUFACTURING PROCESS PARAMETER ESTIM...
- Publication number 20240060906
- Publication date Feb 22, 2024
- ASML NETHERLANDS B.V.
- Bart Jacobus Martinus TIEMERSMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODULAR AUTOENCODER MODEL FOR MANUFACTURING PROCESS PARAMETER ESTIM...
- Publication number 20240061347
- Publication date Feb 22, 2024
- ASML NETHERLANDS B.V.
- Alexandru ONOSE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY METHOD AND APPARATUS, COMPUTER PROGRAM AND LITHOGRAPHIC S...
- Publication number 20220171290
- Publication date Jun 2, 2022
- ASML NETHERLANDS B.V.
- Alexandru ONOSE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Nick VERHEUL

Person

Patents Grantslast 30 patents

Metrology method and apparatus, computer program and lithographic s...

Patents Applicationslast 30 patents

METHODS RELATED TO AN AUTOENCODER MODEL OR SIMILAR FOR MANUFACTURIN...

METROLOGY METHOD AND APPARATUS, COMPUTER PROGRAM AND LITHOGRAPHIC S...

MODULAR AUTOENCODER MODEL FOR MANUFACTURING PROCESS PARAMETER ESTIM...

MODULAR AUTOENCODER MODEL FOR MANUFACTURING PROCESS PARAMETER ESTIM...

MODULAR AUTOENCODER MODEL FOR MANUFACTURING PROCESS PARAMETER ESTIM...

METROLOGY METHOD AND APPARATUS, COMPUTER PROGRAM AND LITHOGRAPHIC S...