Nickhil Jakatdar

Person

Los Altos, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Offline content distribution networks
- Patent number 10,367,882
- Issue date Jul 30, 2019
- PCCW VUCLIP (SINGAPORE) PTE. LTD.
- Nickhil Jakatdar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Offline content distribution networks
- Patent number 9,730,033
- Issue date Aug 8, 2017
- VUCLIP (SINGAPORE) PTE. LTD.
- Nickhil Jakatdar
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Offline content distribution networks
- Patent number 9,374,685
- Issue date Jun 21, 2016
- Vuclip
- Nickhil Jakatdar
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Offline content distribution networks
- Patent number 9,197,696
- Issue date Nov 24, 2015
- Vuclip
- Nickhil Jakatdar
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Modeling and cross correlation of design predicted criticalities fo...
- Patent number 8,407,630
- Issue date Mar 26, 2013
- Cadence Design Systems, Inc.
- Kevin Chan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for mask optimization
- Patent number 8,156,450
- Issue date Apr 10, 2012
- Cadence Design Systems, Inc.
- Kevin Chan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for process optimization
- Patent number 8,146,024
- Issue date Mar 27, 2012
- Cadence Design Systems, Inc.
- Kevin Chan
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods, systems, and computer program products for implementing co...
- Patent number 8,136,068
- Issue date Mar 13, 2012
- Cadence Design Systems, Inc.
- Li J. Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical metrology of structures formed on semiconductor wafers usin...
- Patent number 7,831,528
- Issue date Nov 9, 2010
- Tokyo Electron Limited
- Srinivas Doddi
- G01 - MEASURING TESTING
Information Patent Grant
Modeling and cross correlation of design predicted criticalities fo...
- Patent number 7,694,244
- Issue date Apr 6, 2010
- Cadence Design Systems, Inc.
- Kevin Chan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for inspection optimization in design and product...
- Patent number 7,665,048
- Issue date Feb 16, 2010
- Cadence Design Systems, Inc.
- Kevin Chan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generation of a library of periodic grating diffraction signals
- Patent number 7,593,119
- Issue date Sep 22, 2009
- Tokyo Electron Limited
- Xinhui Niu
- G01 - MEASURING TESTING
Information Patent Grant
Generation and use of integrated circuit profile-based simulation i...
- Patent number 7,580,823
- Issue date Aug 25, 2009
- Tokyo Electron Limited
- Nickhil Jakatdar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Model and parameter selection for optical metrology
- Patent number 7,505,153
- Issue date Mar 17, 2009
- Timbre Technologies, Inc.
- Vi Vuong
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Selection of wavelengths for integrated circuit optical metrology
- Patent number 7,474,993
- Issue date Jan 6, 2009
- Timbre Technologies, Inc.
- Srinivas Doddi
- G01 - MEASURING TESTING
Information Patent Grant
Generic interface for an optical metrology system
- Patent number 7,450,232
- Issue date Nov 11, 2008
- Timbre Technologies, Inc.
- Shifang Li
- G01 - MEASURING TESTING
Information Patent Grant
Selecting a hypothetical profile to use in optical metrology
- Patent number 7,394,554
- Issue date Jul 1, 2008
- Timbre Technologies, Inc.
- Vi Vuong
- G01 - MEASURING TESTING
Information Patent Grant
Model and parameter selection for optical metrology
- Patent number 7,330,279
- Issue date Feb 12, 2008
- Timbre Technologies, Inc.
- Vi Vuong
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Generation of a library of periodic grating diffraction signals
- Patent number 7,277,189
- Issue date Oct 2, 2007
- Timbre Technologies, Inc.
- Xinhui Niu
- G01 - MEASURING TESTING
Information Patent Grant
Generic interface for an optical metrology system
- Patent number 7,271,902
- Issue date Sep 18, 2007
- Timbre Technologies, Inc.
- Shifang Li
- G01 - MEASURING TESTING
Information Patent Grant
Selection of wavelengths for integrated circuit optical metrology
- Patent number 7,216,045
- Issue date May 8, 2007
- Timbre Technologies, Inc.
- Srinivas Doddi
- G01 - MEASURING TESTING
Information Patent Grant
Generation and use of integrated circuit profile-based simulation i...
- Patent number 7,136,796
- Issue date Nov 14, 2006
- Timbre Technologies, Inc.
- Nickhil Jakatdar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimized model and parameter selection for optical metrology
- Patent number 7,092,110
- Issue date Aug 15, 2006
- Timbre Technologies, Inc.
- Raghu Balasubramanian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Model optimization for structures with additional materials
- Patent number 7,072,049
- Issue date Jul 4, 2006
- Timbre Technologies, Inc.
- Xinhui Niu
- G01 - MEASURING TESTING
Information Patent Grant
Generic interface for an optical metrology system
- Patent number 7,064,829
- Issue date Jun 20, 2006
- Timbre Technologies, Inc.
- Shifang Li
- G01 - MEASURING TESTING
Information Patent Grant
Balancing planarization of layers and the effect of underlying stru...
- Patent number 7,041,515
- Issue date May 9, 2006
- Timbre Technologies, Inc.
- Nickhil Jakatdar
- G01 - MEASURING TESTING
Information Patent Grant
Generating a library of simulated-diffraction signals and hypotheti...
- Patent number 7,031,894
- Issue date Apr 18, 2006
- Timbre Technologies, Inc.
- Xinhui Niu
- G01 - MEASURING TESTING
Information Patent Grant
Method and system of dynamic learning through a regression-based li...
- Patent number 6,961,679
- Issue date Nov 1, 2005
- Timbre Technologies, Inc.
- Xinhui Niu
- G01 - MEASURING TESTING
Information Patent Grant
Caching of intra-layer calculations for rapid rigorous coupled-wave...
- Patent number 6,952,271
- Issue date Oct 4, 2005
- Timbre Technologies, Inc.
- Xinhui Niu
- G01 - MEASURING TESTING
Information Patent Grant
Generation of a library of periodic grating diffraction signals
- Patent number 6,943,900
- Issue date Sep 13, 2005
- Timbre Technologies, Inc.
- Xinhui Niu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OFFLINE CONTENT DISTRIBUTION NETWORKS
- Publication number 20170331885
- Publication date Nov 16, 2017
- VUCLIP (SINGAPORE) PTE. LTD.
- Nickhil Jakatdar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OFFLINE CONTENT DISTRIBUTION NETWORKS
- Publication number 20160295379
- Publication date Oct 6, 2016
- VUCLIP (SINGAPORE) PTE. LTD.
- Nickhil Jakatdar
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHODS, SYSTEM, AND COMPUTER PROGRAM PRODCUT FOR IMPLEMENTING COMP...
- Publication number 20100083200
- Publication date Apr 1, 2010
- Cadence Design Systems, Inc.
- Li J. Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL METROLOGY OF STRUCTURES FORMED ON SEMICONDUCTOR WAFERS USIN...
- Publication number 20090198635
- Publication date Aug 6, 2009
- Timbre Technologies, Inc.
- Srinivas Doddi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATION OF A LIBRARY OF PERIODIC GRATING DIFFRACTION SIGNALS
- Publication number 20080249754
- Publication date Oct 9, 2008
- Timbre Technologies, Inc.
- Xinhui Niu
- G02 - OPTICS
Information Patent Application
MODEL AND PARAMETER SELECTION FOR OPTICAL METROLOGY
- Publication number 20080151269
- Publication date Jun 26, 2008
- Timbre Technologies, Inc.
- Vi Vuong
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND SYSTEM FOR PROCESS OPTIMIZATION
- Publication number 20080148194
- Publication date Jun 19, 2008
- Cadence Design Systems, Inc.
- Kevin Chan
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND SYSTEM FOR INSPECTION OPTIMIZATION
- Publication number 20080148195
- Publication date Jun 19, 2008
- Cadence Design Systems, Inc.
- Kevin Chan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODELING AND CROSS CORRELATION OF DESIGN PREDICTED CRITICALITIES FO...
- Publication number 20080147374
- Publication date Jun 19, 2008
- Cadence Design Systems, Inc.
- Kevin Chan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR MASK OPTIMIZATION
- Publication number 20080148216
- Publication date Jun 19, 2008
- Cadence Design Systems, Inc.
- Kevin Chan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERIC INTERFACE FOR AN OPTICAL METROLOGY SYSTEM
- Publication number 20080037017
- Publication date Feb 14, 2008
- TOKYO ELECTRON LIMITED
- Shifang Li
- G01 - MEASURING TESTING
Information Patent Application
Selection of wavelengths for integrated circuit optical metrology
- Publication number 20070198211
- Publication date Aug 23, 2007
- Timbre Technologies, Inc.
- Srinivas Doddi
- G01 - MEASURING TESTING
Information Patent Application
Generation and use of integrated circuit profile-based simulation i...
- Publication number 20070118349
- Publication date May 24, 2007
- TOKYO ELECTRON LIMITED
- Nickhil Jakatdar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Generic interface for an optical metrology system
- Publication number 20060244966
- Publication date Nov 2, 2006
- TOKYO ELECTRON LIMITED
- Shifang Li
- G01 - MEASURING TESTING
Information Patent Application
Generation of a library of periodic grating diffraction signals
- Publication number 20050256687
- Publication date Nov 17, 2005
- Timbre Technologies, Inc.
- Xinhui Niu
- G02 - OPTICS
Information Patent Application
Caching of intra-layer calculations for rapid rigorous coupled-wave...
- Publication number 20050068545
- Publication date Mar 31, 2005
- Xinhui Niu
- G02 - OPTICS
Information Patent Application
Selecting a hypothetical profile to use in optical metrology
- Publication number 20050057748
- Publication date Mar 17, 2005
- TimbreTechnologies, Inc.
- Vi Vuong
- G01 - MEASURING TESTING
Information Patent Application
Optical metrology of structures formed on semiconductor wafer using...
- Publication number 20040267397
- Publication date Dec 30, 2004
- Srinivas Doddi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system of dynamic learning through a regression-based li...
- Publication number 20040225477
- Publication date Nov 11, 2004
- Timbre Technologies, Inc.
- Xinhui Niu
- G01 - MEASURING TESTING
Information Patent Application
Method and system of dynamic learning through a regression-based li...
- Publication number 20040220760
- Publication date Nov 4, 2004
- Timbre Technologies, Inc.
- Xinhui Niu
- G01 - MEASURING TESTING
Information Patent Application
Generic interface for an optical metrology system
- Publication number 20040184035
- Publication date Sep 23, 2004
- Shifang Li
- G01 - MEASURING TESTING
Information Patent Application
Model optimization for structures with additional materials
- Publication number 20040150838
- Publication date Aug 5, 2004
- Xinhui Niu
- G01 - MEASURING TESTING
Information Patent Application
Balancing planarization of layers and the effect of underlying stru...
- Publication number 20040147048
- Publication date Jul 29, 2004
- Timbre Technologies, Inc.
- Nickhil Jakatdar
- G01 - MEASURING TESTING
Information Patent Application
Grating test patterns and methods for overlay metrology
- Publication number 20040137341
- Publication date Jul 15, 2004
- Xinhui Niu
- G02 - OPTICS
Information Patent Application
Model and parameter selection for optical metrology
- Publication number 20040017574
- Publication date Jan 29, 2004
- Vi Vuong
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Optimized model and parameter selection for optical metrology
- Publication number 20040017575
- Publication date Jan 29, 2004
- Raghu Balasubramanian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Selection of wavelengths for integrated circuit optical metrology
- Publication number 20030225535
- Publication date Dec 4, 2003
- Srinivas Doddi
- G01 - MEASURING TESTING
Information Patent Application
Overlay measurements using periodic gratings
- Publication number 20030212525
- Publication date Nov 13, 2003
- Joerg Bischoff
- G01 - MEASURING TESTING
Information Patent Application
Optical profilometry of additional-material deviations in a periodi...
- Publication number 20030204325
- Publication date Oct 30, 2003
- Xinhui Niu
- G02 - OPTICS
Information Patent Application
COMBINED OPTICAL PROFILOMETRY AND PROJECTION MICROSCOPY OF INTEGRAT...
- Publication number 20030203590
- Publication date Oct 30, 2003
- Wenge Yang
- G01 - MEASURING TESTING

Nickhil Jakatdar

Person

Patents Grantslast 30 patents

Offline content distribution networks

Offline content distribution networks

Offline content distribution networks

Offline content distribution networks

Modeling and cross correlation of design predicted criticalities fo...

Method and system for mask optimization

Method and system for process optimization

Methods, systems, and computer program products for implementing co...

Optical metrology of structures formed on semiconductor wafers usin...

Modeling and cross correlation of design predicted criticalities fo...

Method and system for inspection optimization in design and product...

Generation of a library of periodic grating diffraction signals

Generation and use of integrated circuit profile-based simulation i...

Model and parameter selection for optical metrology

Selection of wavelengths for integrated circuit optical metrology

Generic interface for an optical metrology system

Selecting a hypothetical profile to use in optical metrology

Model and parameter selection for optical metrology

Generation of a library of periodic grating diffraction signals

Generic interface for an optical metrology system

Selection of wavelengths for integrated circuit optical metrology

Generation and use of integrated circuit profile-based simulation i...

Optimized model and parameter selection for optical metrology

Model optimization for structures with additional materials

Generic interface for an optical metrology system

Balancing planarization of layers and the effect of underlying stru...

Generating a library of simulated-diffraction signals and hypotheti...

Method and system of dynamic learning through a regression-based li...

Caching of intra-layer calculations for rapid rigorous coupled-wave...

Generation of a library of periodic grating diffraction signals

Patents Applicationslast 30 patents

OFFLINE CONTENT DISTRIBUTION NETWORKS

OFFLINE CONTENT DISTRIBUTION NETWORKS

METHODS, SYSTEM, AND COMPUTER PROGRAM PRODCUT FOR IMPLEMENTING COMP...

OPTICAL METROLOGY OF STRUCTURES FORMED ON SEMICONDUCTOR WAFERS USIN...

GENERATION OF A LIBRARY OF PERIODIC GRATING DIFFRACTION SIGNALS

MODEL AND PARAMETER SELECTION FOR OPTICAL METROLOGY

METHOD AND SYSTEM FOR PROCESS OPTIMIZATION

METHOD AND SYSTEM FOR INSPECTION OPTIMIZATION

MODELING AND CROSS CORRELATION OF DESIGN PREDICTED CRITICALITIES FO...

METHOD AND SYSTEM FOR MASK OPTIMIZATION

GENERIC INTERFACE FOR AN OPTICAL METROLOGY SYSTEM

Selection of wavelengths for integrated circuit optical metrology

Generation and use of integrated circuit profile-based simulation i...

Generic interface for an optical metrology system

Generation of a library of periodic grating diffraction signals

Caching of intra-layer calculations for rapid rigorous coupled-wave...

Selecting a hypothetical profile to use in optical metrology

Optical metrology of structures formed on semiconductor wafer using...

Method and system of dynamic learning through a regression-based li...

Method and system of dynamic learning through a regression-based li...

Generic interface for an optical metrology system

Model optimization for structures with additional materials

Balancing planarization of layers and the effect of underlying stru...

Grating test patterns and methods for overlay metrology

Model and parameter selection for optical metrology

Optimized model and parameter selection for optical metrology

Selection of wavelengths for integrated circuit optical metrology

Overlay measurements using periodic gratings

Optical profilometry of additional-material deviations in a periodi...

COMBINED OPTICAL PROFILOMETRY AND PROJECTION MICROSCOPY OF INTEGRAT...