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Nickolay MOKICHEV
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San Jose, CA, US
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last 30 patents
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Patent Grant
Systems and methods for defect detection using a whole raw image
Patent number
8,866,899
Issue date
Oct 21, 2014
Photon Dynamics Inc.
Nickolay Mokichev
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SYSTEMS AND METHODS FOR DEFECT DETECTION USING A WHOLE RAW IMAGE
Publication number
20120314057
Publication date
Dec 13, 2012
PHOTO DYNAMICS, INC.
Nickolay MOKICHEV
G01 - MEASURING TESTING