Nicolas BERNIER

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Grenoble, FR

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Patents Grantslast 30 patents

Information Patent Grant
Electron microscopy analysis method
- Patent number 11,686,693
- Issue date Jun 27, 2023
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Nicolas Bernier
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON MICROSCOPY ANALYSIS METHOD
- Publication number 20210010956
- Publication date Jan 14, 2021
- Commissariat a I'Energie Atomique et aux Energies Alternatives
- Nicolas BERNIER
- G01 - MEASURING TESTING