Nicolas DEGRENNE

Person

Rennes cedex 7, FR

People

Patents Grantslast 30 patents

Information Patent Grant
Method and device for monitoring gate signal of power semiconductor
- Patent number 12,013,428
- Issue date Jun 18, 2024
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- G01 - MEASURING TESTING
Information Patent Grant
Power semi-conductor module, mask, measurement method, computer sof...
- Patent number 11,927,619
- Issue date Mar 12, 2024
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- G01 - MEASURING TESTING
Information Patent Grant
Method for estimating degradation of a wire-bonded power semi-condu...
- Patent number 11,474,146
- Issue date Oct 18, 2022
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for monitoring the health of a power semiconducto...
- Patent number 11,378,612
- Issue date Jul 5, 2022
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- G01 - MEASURING TESTING
Information Patent Grant
Inductive assembly and method of manufacturing inductive assembly
- Patent number 11,217,378
- Issue date Jan 4, 2022
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diagnostic device and method to establish degradation state of elec...
- Patent number 11,169,201
- Issue date Nov 9, 2021
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for controlling switching
- Patent number 11,152,934
- Issue date Oct 19, 2021
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Printed circuit board and method for manufacturing printed circuit...
- Patent number 10,827,619
- Issue date Nov 3, 2020
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and device for estimating level of damage or lifetime expect...
- Patent number 10,782,338
- Issue date Sep 22, 2020
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- G01 - MEASURING TESTING
Information Patent Grant
Method, device and system for estimating level of damage of electri...
- Patent number 10,732,617
- Issue date Aug 4, 2020
- Mitsubishi Electric Corporation
- Stefan Mollov
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and device for estimating level of damage or lifetime expect...
- Patent number 10,705,133
- Issue date Jul 7, 2020
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- G01 - MEASURING TESTING
Information Patent Grant
Power module and method for manufacturing power module
- Patent number 10,622,281
- Issue date Apr 14, 2020
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for determining if deterioration occurs in interf...
- Patent number 10,495,681
- Issue date Dec 3, 2019
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR INCREASING LIFETIME OF POWER DIE OR POWER MODULE
- Publication number 20240272222
- Publication date Aug 15, 2024
- Mitsubishi Electric Corporation
- Merouane OUHAB
- G01 - MEASURING TESTING
Information Patent Application
POWER SEMICONDUCTOR MODULE WITH ONLINE DEAD-TIME ADJUSTMENT BASED O...
- Publication number 20240055981
- Publication date Feb 15, 2024
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
METHOD FOR ESTIMATING PARAMETERS OF A JUNCTION OF A POWER SEMI-COND...
- Publication number 20230003586
- Publication date Jan 5, 2023
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MONITORING GATE SIGNAL OF POWER SEMICONDUCTOR
- Publication number 20220091177
- Publication date Mar 24, 2022
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
POWER SEMI-CONDUCTOR MODULE, MASK, MEASUREMENT METHOD, COMPUTER SOF...
- Publication number 20210223307
- Publication date Jul 22, 2021
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR CONTROLLING SWITCHING
- Publication number 20210175883
- Publication date Jun 10, 2021
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DEVICE AND METHOD FOR MONITORING POWER SEMICONDUCTOR DIE
- Publication number 20210172994
- Publication date Jun 10, 2021
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ESTIMATING DEGRADATION
- Publication number 20200408830
- Publication date Dec 31, 2020
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSTIC DEVICE AND METHOD TO ESTABLISH DEGRADATION STATE OF ELEC...
- Publication number 20200256912
- Publication date Aug 13, 2020
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- G01 - MEASURING TESTING
Information Patent Application
INDUCTIVE ASSEMBLY AND METHOD OF MANUFACTURING INDUCTIVE ASSEMBLY
- Publication number 20200075216
- Publication date Mar 5, 2020
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD AND DEVICE FOR ESTIMATING LEVEL OF DAMAGE OR LIFETIME EXPECT...
- Publication number 20190331729
- Publication date Oct 31, 2019
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- G01 - MEASURING TESTING
Information Patent Application
PRINTED CIRCUIT BOARD AND METHOD FOR MANUFACTURING PRINTED CIRCUIT...
- Publication number 20190320534
- Publication date Oct 17, 2019
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR ESTIMATING LEVEL OF DAMAGE OR LIFETIME EXPECT...
- Publication number 20190285689
- Publication date Sep 19, 2019
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- G01 - MEASURING TESTING
Information Patent Application
POWER MODULE AND METHOD FOR MANUFACTURING POWER MODULE
- Publication number 20190043781
- Publication date Feb 7, 2019
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD, DEVICE AND SYSTEM FOR ESTIMATING LEVEL OF DAMAGE OF ELECTRI...
- Publication number 20180329403
- Publication date Nov 15, 2018
- Mitsubishi Electric Corporation
- Stefan MOLLOV
- G05 - CONTROLLING REGULATING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING IF DETERIORATION OCCURS IN INTERF...
- Publication number 20180188309
- Publication date Jul 5, 2018
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- G01 - MEASURING TESTING

Nicolas DEGRENNE

Person

Patents Grantslast 30 patents

Method and device for monitoring gate signal of power semiconductor

Power semi-conductor module, mask, measurement method, computer sof...

Method for estimating degradation of a wire-bonded power semi-condu...

Device and method for monitoring the health of a power semiconducto...

Inductive assembly and method of manufacturing inductive assembly

Diagnostic device and method to establish degradation state of elec...

Device and method for controlling switching

Printed circuit board and method for manufacturing printed circuit...

Method and device for estimating level of damage or lifetime expect...

Method, device and system for estimating level of damage of electri...

Method and device for estimating level of damage or lifetime expect...

Power module and method for manufacturing power module

System and method for determining if deterioration occurs in interf...

Patents Applicationslast 30 patents

METHOD AND DEVICE FOR INCREASING LIFETIME OF POWER DIE OR POWER MODULE

POWER SEMICONDUCTOR MODULE WITH ONLINE DEAD-TIME ADJUSTMENT BASED O...

METHOD FOR ESTIMATING PARAMETERS OF A JUNCTION OF A POWER SEMI-COND...

METHOD AND DEVICE FOR MONITORING GATE SIGNAL OF POWER SEMICONDUCTOR

POWER SEMI-CONDUCTOR MODULE, MASK, MEASUREMENT METHOD, COMPUTER SOF...

DEVICE AND METHOD FOR CONTROLLING SWITCHING

DEVICE AND METHOD FOR MONITORING POWER SEMICONDUCTOR DIE

METHOD FOR ESTIMATING DEGRADATION

DIAGNOSTIC DEVICE AND METHOD TO ESTABLISH DEGRADATION STATE OF ELEC...

INDUCTIVE ASSEMBLY AND METHOD OF MANUFACTURING INDUCTIVE ASSEMBLY

METHOD AND DEVICE FOR ESTIMATING LEVEL OF DAMAGE OR LIFETIME EXPECT...

PRINTED CIRCUIT BOARD AND METHOD FOR MANUFACTURING PRINTED CIRCUIT...

METHOD AND DEVICE FOR ESTIMATING LEVEL OF DAMAGE OR LIFETIME EXPECT...

POWER MODULE AND METHOD FOR MANUFACTURING POWER MODULE

METHOD, DEVICE AND SYSTEM FOR ESTIMATING LEVEL OF DAMAGE OF ELECTRI...

SYSTEM AND METHOD FOR DETERMINING IF DETERIORATION OCCURS IN INTERF...