Nicolas Mauricio WEISS

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Hilversum, NL

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Patents Grantslast 30 patents

Information Patent Grant
Method of determining information about a patterning process, metho...
- Patent number 11,604,419
- Issue date Mar 14, 2023
- ASML Netherlands B.V.
- Joannes Jitse Venselaar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of determining information about a patterning process, metho...
- Patent number 11,022,897
- Issue date Jun 1, 2021
- ASML Netherlands B.V.
- Joannes Jitse Venselaar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of measuring a parameter of interest, inspection apparatus,...
- Patent number 10,705,430
- Issue date Jul 7, 2020
- ASML Netherlands B.V.
- Gonzalo Roberto Sanguinetti
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF DETERMINING INFORMATION ABOUT A PATTERNING PROCESS, METHO...
- Publication number 20210255552
- Publication date Aug 19, 2021
- ASML NETHERLANDS B.V.
- Joannes Jitse VENSELAAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DETERMINING INFORMATION ABOUT A PATTERNING PROCESS, METHO...
- Publication number 20190171115
- Publication date Jun 6, 2019
- ASML NETHERLANDS B.V.
- Joannes Jitse VENSELAAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF MEASURING A PARAMETER OF INTEREST, INSPECTION APPARATUS,...
- Publication number 20180341182
- Publication date Nov 29, 2018
- ASML NETHERLANDS B.V.
- Gonzalo Roberto SANGUINETTI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY