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Nicolas Siedl
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Villach, AT
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last 30 patents
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Patent Grant
Inspection method for semiconductor substrates using slope data and...
Patent number
10,782,242
Issue date
Sep 22, 2020
Infineon Technologies AG
Robert Muhr
G06 - COMPUTING CALCULATING COUNTING
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last 30 patents
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Patent Application
Inspection Method for Semiconductor Substrates Using Slope Data and...
Publication number
20190178808
Publication date
Jun 13, 2019
Robert Muhr
G06 - COMPUTING CALCULATING COUNTING