Nidhi Sinha

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New Delhi, IN

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Patents Grantslast 30 patents

Information Patent Grant
System for controlling memory operations in system-on-chips
- Patent number 11,307,767
- Issue date Apr 19, 2022
- NXP USA, INC.
- Nidhi Sinha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in self-testing and failure correction circuitry
- Patent number 11,177,015
- Issue date Nov 16, 2021
- NXP USA, INC.
- Nidhi Sinha
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for detecting clock failure
- Patent number 10,848,140
- Issue date Nov 24, 2020
- NXP USA, INC.
- Dinesh Joshi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reset circuitry for integrated circuit
- Patent number 9,494,969
- Issue date Nov 15, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Aniruddha Gupta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Debug circuit for an integrated circuit
- Patent number 9,476,937
- Issue date Oct 25, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Garima Sharda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR CONTROLLING MEMORY OPERATIONS IN SYSTEM-ON-CHIPS
- Publication number 20220121360
- Publication date Apr 21, 2022
- NXP USA, Inc.
- Nidhi Sinha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BUILT-IN SELF-TESTING AND FAILURE CORRECTION CIRCUITRY
- Publication number 20210174888
- Publication date Jun 10, 2021
- NXP USA, Inc.
- Nidhi Sinha
- G11 - INFORMATION STORAGE
Information Patent Application
DEBUG CIRCUIT FOR AN INTEGRATED CIRCUIT
- Publication number 20160109515
- Publication date Apr 21, 2016
- Garima Sharda
- G01 - MEASURING TESTING
Information Patent Application
RESET CIRCUITRY FOR INTEGRATED CIRCUIT
- Publication number 20160048155
- Publication date Feb 18, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Anirudhha Gupta
- G06 - COMPUTING CALCULATING COUNTING