Niels GEYPEN

Person

Lommel, BE

People

Patents Grantslast 30 patents

Information Patent Grant
HHG source, inspection apparatus and method for performing a measur...
- Patent number 10,816,906
- Issue date Oct 27, 2020
- ASML Netherlands B.V.
- Nan Lin
- G02 - OPTICS
Information Patent Grant
Metrology apparatus for and a method of determining a characteristi...
- Patent number 10,670,974
- Issue date Jun 2, 2020
- ASML Netherlands B.V.
- Gerrit Jacobus Hendrik Brussaard
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of aligning a pair of complementary diffraction patterns and...
- Patent number 10,401,739
- Issue date Sep 3, 2019
- ASML Netherlands B.V.
- Niels Geypen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
HHG source, inspection apparatus and method for performing a measur...
- Patent number 10,234,771
- Issue date Mar 19, 2019
- ASML Netherlands B.V.
- Nan Lin
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETERMINING A STOCHASTIC METRIC RELATING TO A LITHOGRAPH...
- Publication number 20240369944
- Publication date Nov 7, 2024
- ASML NETHERLANDS B.V.
- Chrysostomos BATISTAKIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CORRECTING MEASUREMENTS IN THE MANUFACTURE OF INTEGRATED...
- Publication number 20230040124
- Publication date Feb 9, 2023
- ASML NETHERLANDS B.V.
- Han-Kwang NIENHUYS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Apparatus for and a Method of Determining a Characteristi...
- Publication number 20190204757
- Publication date Jul 4, 2019
- ASML NETHERLANDS B.V.
- Gerrit Jacobus Hendrik BRUSSAARD
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
HHG Source, Inspection Apparatus and Method for Performing a Measur...
- Publication number 20190155171
- Publication date May 23, 2019
- ASML NETHERLANDS B.V.
- Nan LIN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF ALIGNING A PAIR OF COMPLEMENTARY DIFFRACTION PATTERNS AND...
- Publication number 20190079410
- Publication date Mar 14, 2019
- ASML NETHERLANDS B.V.
- Niels Geypen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
HHG Source, Inspection Apparatus and Method for Performing a Measur...
- Publication number 20170315456
- Publication date Nov 2, 2017
- ASML NETHERLANDS B.V.
- Nan LIN
- G02 - OPTICS

Niels GEYPEN

Person

Patents Grantslast 30 patents

HHG source, inspection apparatus and method for performing a measur...

Metrology apparatus for and a method of determining a characteristi...

Method of aligning a pair of complementary diffraction patterns and...

HHG source, inspection apparatus and method for performing a measur...

Patents Applicationslast 30 patents

METHOD FOR DETERMINING A STOCHASTIC METRIC RELATING TO A LITHOGRAPH...

METHOD FOR CORRECTING MEASUREMENTS IN THE MANUFACTURE OF INTEGRATED...

Metrology Apparatus for and a Method of Determining a Characteristi...

HHG Source, Inspection Apparatus and Method for Performing a Measur...

METHOD OF ALIGNING A PAIR OF COMPLEMENTARY DIFFRACTION PATTERNS AND...

HHG Source, Inspection Apparatus and Method for Performing a Measur...