Berkeley, CA, US
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Patent Grant
The Regents of the University of California
Ali Javey
G01 - MEASURING TESTING
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Patent Application
The Regents of the University of California
Zhen Yuan
G01 - MEASURING TESTING
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Patent Application
The Regents of the University of California
Niharika Gupta
G01 - MEASURING TESTING
Information
Patent Application
The Regents of the University of California
Ali Javey
G01 - MEASURING TESTING
