Nihat Okulan

Person

Santa Barbara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor strain gauge and method of manufacturing same
- Patent number 10,879,449
- Issue date Dec 29, 2020
- Nihat Okulan
- G01 - MEASURING TESTING
Information Patent Grant
Probe for a scanning probe microscope and method of manufacture
- Patent number 8,857,247
- Issue date Oct 14, 2014
- Bruker Nano, Inc.
- Kevin J. Kjoller
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probes for use in scanning probe microscopes and methods of fabrica...
- Patent number 7,370,515
- Issue date May 13, 2008
- Veeco Instruments Inc.
- Nihat Okulan
- G01 - MEASURING TESTING
Information Patent Grant
Methods of fabricating structures for characterizing tip shape of s...
- Patent number 7,210,330
- Issue date May 1, 2007
- Veeco Instruments, Inc.
- Ami Chand
- G01 - MEASURING TESTING
Information Patent Grant
Methods of fabricating structures for characterizing tip shape of s...
- Patent number 7,096,711
- Issue date Aug 29, 2006
- Veeco Instruments Inc.
- Ami Chand
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Strain Gauge and Method for Manufacturing Same
- Publication number 20210257539
- Publication date Aug 19, 2021
- ADVANCED NANOSTRUCTURES, LLC
- Nihat Okulan
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Strain Gage and Method of Manufacturing Same
- Publication number 20190383677
- Publication date Dec 19, 2019
- Nihat Okulan
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR A SCANNING PROBE MICROSCOPE AND METHOD OF MANUFACTURE
- Publication number 20080282819
- Publication date Nov 20, 2008
- Veeco Instruments Inc.
- Kevin J. Kjoller
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF FABRICATING STRUCTURES FOR CHARACTERIZING TIP SHAPE OF S...
- Publication number 20060277972
- Publication date Dec 14, 2006
- Veeco Instruments Inc.
- Ami Chand
- G01 - MEASURING TESTING
Information Patent Application
Probe for a scanning probe microscope and method of manufacture
- Publication number 20060213289
- Publication date Sep 28, 2006
- Kevin J. Kjoller
- G01 - MEASURING TESTING
Information Patent Application
Probes for use in scanning probe microscopes and methods of fabrica...
- Publication number 20050279729
- Publication date Dec 22, 2005
- Veeco Instruments Inc.
- Nihat Okulan
- G01 - MEASURING TESTING
Information Patent Application
Methods of fabricating structures for characterizing tip shape of s...
- Publication number 20050252282
- Publication date Nov 17, 2005
- Veeco Instruments, Inc.
- Ami Chand
- G01 - MEASURING TESTING

Nihat Okulan

Person

Patents Grantslast 30 patents

Semiconductor strain gauge and method of manufacturing same

Probe for a scanning probe microscope and method of manufacture

Probes for use in scanning probe microscopes and methods of fabrica...

Methods of fabricating structures for characterizing tip shape of s...

Methods of fabricating structures for characterizing tip shape of s...

Patents Applicationslast 30 patents

Semiconductor Strain Gauge and Method for Manufacturing Same

Semiconductor Strain Gage and Method of Manufacturing Same

PROBE FOR A SCANNING PROBE MICROSCOPE AND METHOD OF MANUFACTURE

METHODS OF FABRICATING STRUCTURES FOR CHARACTERIZING TIP SHAPE OF S...

Probe for a scanning probe microscope and method of manufacture

Probes for use in scanning probe microscopes and methods of fabrica...

Methods of fabricating structures for characterizing tip shape of s...