Nikila Krishnamoorthy

Person

Karnataka, IN

People

Patents Grantslast 30 patents

Information Patent Grant
System for scan mode exit and methods for scan mode exit
- Patent number 12,196,804
- Issue date Jan 14, 2025
- NXP B.V.
- Tarun Kumar Goyal
- G01 - MEASURING TESTING
Information Patent Grant
System and method for testing clocking systems in integrated circuits
- Patent number 11,879,939
- Issue date Jan 23, 2024
- NXP B.V.
- Nikila Krishnamoorthy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Signal toggling detection and correction circuit
- Patent number 11,686,769
- Issue date Jun 27, 2023
- NXP B.V.
- Shikhar Makkar
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for digital only secure test mode entry
- Patent number 11,144,677
- Issue date Oct 12, 2021
- NXP USA, INC.
- Stefan Doll
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method of scan reset upon entering scan mode
- Patent number 10,955,473
- Issue date Mar 23, 2021
- NXP B.V.
- Sandeep Jain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for debugging scan chains
- Patent number 8,458,541
- Issue date Jun 4, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Grant
Sequential scan based techniques to test interface between modules...
- Patent number 7,421,634
- Issue date Sep 2, 2008
- Texas Instruments Incorporated
- Naga Satya Srikanth Puvvada
- G01 - MEASURING TESTING
Information Patent Grant
Testing of modules operating with different characteristics of cont...
- Patent number 7,213,184
- Issue date May 1, 2007
- Texas Instruments Incorporated
- Nikila Krishnamoorthy
- G01 - MEASURING TESTING
Information Patent Grant
At-speed ATPG testing and apparatus for SoC designs having multiple...
- Patent number 7,134,061
- Issue date Nov 7, 2006
- Texas Instruments Incorporated
- Anupama Aniruddha Agashe
- G01 - MEASURING TESTING
Information Patent Grant
Mechanism to enhance observability of integrated circuit failures d...
- Patent number 7,120,842
- Issue date Oct 10, 2006
- Texas Instruments Incorporated
- Gordhan Barevadia
- G11 - INFORMATION STORAGE
Information Patent Grant
Mixed-signal core design for concurrent testing of mixed-signal, an...
- Patent number 6,925,408
- Issue date Aug 2, 2005
- Texas Instruments Incorporated
- Amit Premy
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR SCAN MODE EXIT AND METHODS FOR SCAN MODE EXIT
- Publication number 20240094284
- Publication date Mar 21, 2024
- NXP B.V.
- Tarun Kumar Goyal
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TESTING CLOCKING SYSTEMS IN INTEGRATED CIRCUITS
- Publication number 20230251310
- Publication date Aug 10, 2023
- NXP B.V.
- Nikila Krishnamoorthy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIGNAL TOGGLING DETECTION AND CORRECTION CIRCUIT
- Publication number 20230213580
- Publication date Jul 6, 2023
- NXP B.V.
- Shikhar Makkar
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Digital Only Secure Test Mode Entry
- Publication number 20210042447
- Publication date Feb 11, 2021
- NXP USA, Inc.
- Stefan Doll
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR DEBUGGING SCAN CHAINS
- Publication number 20120246531
- Publication date Sep 27, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Application
Sequential Scan Based Techniques to Test Interface Between Modules...
- Publication number 20060248422
- Publication date Nov 2, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Naga Satya Srikanth Puvvada
- G01 - MEASURING TESTING
Information Patent Application
Testing of modules operating with different characteristics of cont...
- Publication number 20050091562
- Publication date Apr 28, 2005
- TEXAS INSTRUMENTS INCORPORATED
- Nikila KRISHNAMOORTHY
- G01 - MEASURING TESTING
Information Patent Application
Mechanism to enhance observability of integrated circuit failures d...
- Publication number 20050066243
- Publication date Mar 24, 2005
- Gordhan Barevadia
- G01 - MEASURING TESTING
Information Patent Application
Mixed-signal core design for concurrent testing of mixed-signal, an...
- Publication number 20050065747
- Publication date Mar 24, 2005
- Amit Premy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
At-speed ATPG testing and apparatus for SoC designs having multiple...
- Publication number 20050055615
- Publication date Mar 10, 2005
- Anupama Anlruddha Agashe
- G01 - MEASURING TESTING

Nikila Krishnamoorthy

Person

Patents Grantslast 30 patents

System for scan mode exit and methods for scan mode exit

System and method for testing clocking systems in integrated circuits

Signal toggling detection and correction circuit

Method and apparatus for digital only secure test mode entry

System and method of scan reset upon entering scan mode

System and method for debugging scan chains

Sequential scan based techniques to test interface between modules...

Testing of modules operating with different characteristics of cont...

At-speed ATPG testing and apparatus for SoC designs having multiple...

Mechanism to enhance observability of integrated circuit failures d...

Mixed-signal core design for concurrent testing of mixed-signal, an...

Patents Applicationslast 30 patents

SYSTEM FOR SCAN MODE EXIT AND METHODS FOR SCAN MODE EXIT

SYSTEM AND METHOD FOR TESTING CLOCKING SYSTEMS IN INTEGRATED CIRCUITS

SIGNAL TOGGLING DETECTION AND CORRECTION CIRCUIT

Method and Apparatus for Digital Only Secure Test Mode Entry

SYSTEM AND METHOD FOR DEBUGGING SCAN CHAINS

Sequential Scan Based Techniques to Test Interface Between Modules...

Testing of modules operating with different characteristics of cont...

Mechanism to enhance observability of integrated circuit failures d...

Mixed-signal core design for concurrent testing of mixed-signal, an...

At-speed ATPG testing and apparatus for SoC designs having multiple...