Niklas Dellby

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Lake Forest Park, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
High resolution energy-selecting electron beam apparatus
- Patent number 8,373,137
- Issue date Feb 12, 2013
- Nion Co.
- Ondrej L. Krivanek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aberration-corrected charged-particle optical apparatus
- Patent number 6,770,887
- Issue date Aug 3, 2004
- Ondrej L. Krivanek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Autoadjusting charged-particle probe-forming apparatus
- Patent number 6,552,340
- Issue date Apr 22, 2003
- Nion Co.
- Ondrej L. Krivanek
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
High resolution energy-selecting electron beam apparatus
- Publication number 20120074315
- Publication date Mar 29, 2012
- Nion Co.
- Ondrej L. Krivanek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Aberration-corrected charged-particle optical apparatus
- Publication number 20040004192
- Publication date Jan 8, 2004
- Ondrej L. Krivanek
- H01 - BASIC ELECTRIC ELEMENTS