Nikolaos Hatzopoulos

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Dresden, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for the elimination of the effects of defects on wafers
- Patent number 7,704,853
- Issue date Apr 27, 2010
- Infineon Technologies AG
- Martin Kerber
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR SUBSTRATE ARRANGEMENT, A SEMICONDUCTOR DEVICE, AND A...
- Publication number 20160211250
- Publication date Jul 21, 2016
- INFINEON TECHNOLOGIES AG
- Wolfram LANGHEINRICH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for the elimination of the effects of defects on wafers
- Publication number 20060240638
- Publication date Oct 26, 2006
- Martin Kerber
- H01 - BASIC ELECTRIC ELEMENTS