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Nikolaos Minas
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Kessel-Lo, BE
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Patents Grants
last 30 patents
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Patent Grant
On-chip testing using time-to-digital conversion
Patent number
8,680,874
Issue date
Mar 25, 2014
IMEC
Nikolaos Minas
G01 - MEASURING TESTING
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Patent Grant
Method and device for testing TSVS in a 3D chip stack
Patent number
8,593,170
Issue date
Nov 26, 2013
IMEC
Geert Van der Plas
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
ON-CHIP TESTING USING TIME-TO-DIGITAL CONVERSION
Publication number
20120025846
Publication date
Feb 2, 2012
IMEC
Nikolaos Minas
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR TESTING TSVS IN A 3D CHIP STACK
Publication number
20110102011
Publication date
May 5, 2011
IMEC
Geert Van der Plas
G01 - MEASURING TESTING