Nikolay A. Mirin

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer alignment markers, systems, and related methods
- Patent number 11,520,240
- Issue date Dec 6, 2022
- Micron Technology, Inc.
- Nikolay A. Mirin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer registration and overlay measurement systems and related methods
- Patent number 11,251,096
- Issue date Feb 15, 2022
- Micron Technology, Inc.
- Nikolay A. Mirin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer alignment markers, systems, and related methods
- Patent number 11,009,798
- Issue date May 18, 2021
- Micron Technology, Inc.
- Nikolay A. Mirin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming semiconductor devices
- Patent number 10,811,355
- Issue date Oct 20, 2020
- Micron Technology, Inc.
- William R. Brown
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor devices including conductive lines and methods of for...
- Patent number 10,388,601
- Issue date Aug 20, 2019
- Micron Technology, Inc.
- William R. Brown
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor devices including conductive lines and methods of for...
- Patent number 9,911,693
- Issue date Mar 6, 2018
- Micron Technology, Inc.
- William R. Brown
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
WAFER REGISTRATION AND OVERLAY MEASUREMENT SYSTEMS AND RELATED METHODS
- Publication number 20220108927
- Publication date Apr 7, 2022
- Micron Technology, Inc.
- Nikolay A. Mirin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER ALIGNMENT MARKERS, SYSTEMS, AND RELATED METHODS
- Publication number 20210263429
- Publication date Aug 26, 2021
- Micron Technology, Inc.
- Nikolay A. Mirin
- G01 - MEASURING TESTING
Information Patent Application
WAFER ALIGNMENT MARKERS, SYSTEMS, AND RELATED METHODS
- Publication number 20200073257
- Publication date Mar 5, 2020
- Micron Technology, Inc.
- Nikolay A. Mirin
- G01 - MEASURING TESTING
Information Patent Application
WAFER REGISTRATION AND OVERLAY MEASUREMENT SYSTEMS AND RELATED METHODS
- Publication number 20200075432
- Publication date Mar 5, 2020
- Micron Technology, Inc.
- Nikolay A. Mirin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING SEMICONDUCTOR DEVICES
- Publication number 20190103350
- Publication date Apr 4, 2019
- Micron Technology, Inc.
- William R. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES INCLUDING CONDUCTIVE LINES AND METHODS OF FOR...
- Publication number 20180114751
- Publication date Apr 26, 2018
- Micron Technology, Inc.
- William R. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES INCLUDING CONDUCTIVE LINES AND METHODS OF FOR...
- Publication number 20170062324
- Publication date Mar 2, 2017
- Micron Technology, Inc.
- William R. Brown
- H01 - BASIC ELECTRIC ELEMENTS

Nikolay A. Mirin

Person

Patents Grantslast 30 patents

Wafer alignment markers, systems, and related methods

Wafer registration and overlay measurement systems and related methods

Wafer alignment markers, systems, and related methods

Methods of forming semiconductor devices

Semiconductor devices including conductive lines and methods of for...

Semiconductor devices including conductive lines and methods of for...

Patents Applicationslast 30 patents

WAFER REGISTRATION AND OVERLAY MEASUREMENT SYSTEMS AND RELATED METHODS

WAFER ALIGNMENT MARKERS, SYSTEMS, AND RELATED METHODS

WAFER ALIGNMENT MARKERS, SYSTEMS, AND RELATED METHODS

WAFER REGISTRATION AND OVERLAY MEASUREMENT SYSTEMS AND RELATED METHODS

METHODS OF FORMING SEMICONDUCTOR DEVICES

SEMICONDUCTOR DEVICES INCLUDING CONDUCTIVE LINES AND METHODS OF FOR...

SEMICONDUCTOR DEVICES INCLUDING CONDUCTIVE LINES AND METHODS OF FOR...