Nilanjan Mukherjee

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Plainsboro, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Bist architecture for detecting path-delay faults in a sequential c...
- Patent number 6,148,425
- Issue date Nov 14, 2000
- Lucent Technologies Inc.
- Sudipta Bhawmik
- G01 - MEASURING TESTING